3
English
Note
• The test leads can add 0.1Ω to 0.3Ω of error to resistance measurement. To obtain precision readings in
low-resistance measurement, under 200Ω, short-circuit the input terminals before and record the reading
obtained. This is the additional resistance from the test lead.
Temperature measurement
(Fig 3).
The included point contact temperature probe can only be used up to 250 °C. For measuring higher
temperatures another probes of type K can be used together with a multi socket.
1. Insert the red socket into the VΩHzºC terminal and the black into the COM terminal.
2. Set the rotary switch to the °C position.
3. Place the temperature probe to the object being measured. The measured value shows on the display.
Diode test
(Fig 1)
To avoid damage of instruments disconnect circuit power and discharge high-voltage capacitors.
The diode test sends a current through the semiconductor junction, and then measures the voltage drop across
the junction. A good silicon junction drops between 0.5V and 0.8V.
1. Insert the red test lead into the VΩHzºC terminal and the black test lead into the COM terminal.
2. Set the rotary switch to diode position.
3. For voltage drop readings on any semiconductor component, place the red test lead on the component’s
anode and the black test lead on the cathode. The measured value shows on the display.
Continuity test
(Fig 1)
To search breaks in circuit or electrical componens. The measuring voltage is around 3 V.
To avoid damage of instruments disconnect circuit power and discharge high-voltage capacitors.
1. Insert the red test lead into the VΩHzºC terminal and the black test lead into the COM terminal.
2. Set the rotary switch to continuity position.
3. Connect the test leads across with the object being measured. The buzzer sounds if the resistance is less
than 70Ω.
Capacitance measurement
(Fig 4)
To avoid damage of instruments disconnect circuit power and discharge high-voltage capacitors.
Use DC voltage to confirm that the capacitor is discharged. Place the red test lead on the component’s anode
and the black test lead on the cathode.
1. Insert the capacitor into capacitance jack.
2. Set the rotary switch to an appropriate measurement position in F range.
3. Connect the test leads across with the object being measured. The measured value shows on the display.
Note
• When 1 displays the capacitor is short-circuit or the selected range is too low. To minimize the measuring
error caused by the distributed capacitor, the testing should be short as possible.
Transistor test
(Fig 5)
1. Set the rotary switch to the hFE position.
2. Connect the NPN or PNP type transistor to be tested into the transistor jack. The measured value shows on
the display.
Frequency
(Fig 1)
1. Insert the red test lead into the VΩHzºC terminal and the black test lead into the COM terminal.
2. Set the rotary switch to an appropriate measurement position in Hz range.
3. Connect the test leads across with the object being measured. The measured value shows on the display.