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0142530-000 AB
KLA-Tencor Confidential
6-1
3/13/09
KLA-Tencor P-16+ / P-6 User’s Guide
Sequence Recipe and Data - Introduction
SEQUENCE RECIPE AND DATA
Chapter 6
6
I
NTRODUCTION
6
Limited Sequence Recipe and Data applications are now standard on the P-16+/P-6.
However, the capability of the Sequence application can be greatly extended using the
1000- site sequence option. The Sequence application uses sequences that contain
multiple scan recipes combined into one file for automatic sequence scanning. This
saves time when repeatedly scanning the same location(s) on multiple samples. The
Sequence Recipe and Data application consists of two parts:
Sequence Recipe Editor to load, create, edit, and save Sequence Recipes for
scanning.
Sequence Database to load, collect, manipulate, and save data obtained from
scanning.
Sequences can be created using any combination of 2D and 3D recipes. The Sequence
Recipe contains information that directs the system to precisely position the sample
beneath the measurement head for each measurement in the sequence of scans. Each
measurement location in a sequence is called a site. The information for how to scan
each site is contained in the Scan Recipe that is connected with the site in the
Sequence Recipe. See
for more information on creating and editing Scan
Recipes.
The Sequencing feature provides the following capabilities:
Combines up to 20 sites and recipes standard, or optionally up to 1000 sites and
recipes
Set reference points for correcting translational and rotational variations
between substrates (deskew)
Re-scan portions of a long scan, using the long scan as a data reference for the
subscans so their measurements correlate with each other
Set Deskew manually or automatically using Pattern Recognition (Optional
feature, P-16+ only)
Set Pattern Recognition options to search locally for a match when a match is
not found in the camera’s field of view at deskew sites, and carry out
user-selected instructions if the search fails
Set pattern recognition to reference sites using site-by-site Pattern Recognition
In Multi Analysis mode, apply different Scan recipes to a single scan
Automatically display, print, export, and save statistics and trace data for all
sites
Teach scan sites and alignment reference points interactively, with or without
theta
Export the data from each wafer immediately following the wafer processing
Choose the number of times the Sequence Recipe is run and allow the data to be
saved for each run
Содержание P-16+
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