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0142530-000 AB
KLA-Tencor Confidential
3-91
3/13/09
KLA-Tencor P-16+ / P-6 User’s Guide
Scan Recipes - Feature Find
Search Patterns: Center Outward, Top to Bottom,
or Bottom to Top
3
There are three different search patterns that can be used in combination with
any of the search types. All of the search patterns can be used with sensor or
sample stage measurements. The search pattern used should be set based upon
feature properties and the surroundings.
A Center Outward search should be used when looking for an isolated feature,
such as an isolated contact or the 5µm box shown in
The Center Outward search is done by performing an x scan in the center of
the search area, then alternating above and below the center of the search area
by the y step size. For Model Feature the search pattern is basically the same,
but it will perform multiple scan lines equal to the model size each time it
shifts above or below the center of the search area. A Center Outward search
pattern is displayed in the Trench / Line illustration, see
A Top to Bottom or a Bottom to Top search should be used when the approach
direction of the Feature Find scan can affect the result of Feature Find or find
the pattern faster. The Model Feature illustration,
used a Bottom
to Top search which would be the best method for this scan since the edge of
the lines array is at the bottom of the scan.
X Scan Size (µm)
3
This defines the size of the scan in the x direction, which should be at a
minimum three times larger than the feature size. In general, it should be even
larger to account for positioning error. The X Scan Size will need to be set for
all search types, with some specific restrictions for Model Feature that are
discussed in detail later in the chapter. When setting up a sample stage recipe,
there are limits on the scan size, but for most applications the limit will not be
reached, so it is not discussed in detail in the User's Guide. When setting up a
sensor stage recipe, the allowable size of the x scan is limited by the recipe x
scan size and any offsets in the Feature Find definition, with total summing to
less than the 90 µm scan size limitation for the sensor stage.
Traces
3
Traces are the number of parallel x direction scans that are performed in the
Feature Find scan separated by the Y Spacing. The number of traces should be
set so that the area searched is at least three times larger than the feature size.
In general, it should be even larger to account for positioning error. Since the
Feature Find algorithms operate in real-time after each scan line is performed,
it does not hurt throughput to set the number of Traces higher than required,
creating a robust recipe that will still find the feature for those cases where
positioning error is higher than normal. The number of Traces will need to be
set for all search types, with some specific restrictions for Model Feature that
will be discussed in detail later in the chapter. When setting up a sample stage
Содержание P-16+
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Страница 24: ...KLA Tencor P 16 P 6 User s Guide LOT 4 KLA Tencor Confidential 0142530 000 AB Friday March 13 2009 Preliminary...
Страница 30: ...Introduction Safety Safety KLA Tencor P 16 P 6 User s Guide 1 6 KLA Tencor Confidential 0142530 000 AB 3 13 09...
Страница 180: ...XY View Screen Aligning the Sample KLA Tencor P 16 P 6 User s Guide 4 32 KLA Tencor Confidential 0142530 000 AB 3 13 09...
Страница 196: ...View Scan Window Aborting A Scan KLA Tencor P 16 P 6 User s Guide 5 16 KLA Tencor Confidential 0142530 000 AB 3 13 09...
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