Section 3: Test subroutine library reference
S530 Parametric Test System Test Subroutine Library User's Manual
3-56
S530-907-01 Rev. A / September 2015
res2
This subroutine measures two-terminal resistance with a voltage limit.
Usage
double res2(int
hi
, int
lo
, int
sub
, double
itest
, double
vlim
)
hi
Input
The HI pin of the device
lo
Input
The LO pin of the device
sub
Input
The substrate pin of the device
itest
Input
The forced current, in amperes
vlim
Input
The voltage limit, in volts
Returns
Output
The calculated resistance:
0.0 = Measured voltage is < 0.002 V or
itest
= 0.0
2.0E+21 = Measured voltage is within 98 % of the voltage limit
Details
This subroutine measures the resistance of a two-terminal resistor by forcing a current and measuring
the voltage.
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the
res2
subroutine; this delay is the calculated time required for stable
forcing of
itest
with
vlim
voltage limit.
Source-measure units (SMUs)
SMU1: Forces
itest
, programmable voltage limit, measures voltage
Example
result = res2(hi, lo, sub, itest, vlim)
Schematic