Limit Testing
11-5
Perform
Limit 1 Test
?
Yes
No
Pass
?
No
Yes
Display
“
FAIL
”
Perform
Limit 2 Test
?
Yes
No
Pass
?
No
Yes
Perform
Limit 3, 5-12
Tests
?
Yes
No
Pass
?
No
Yes
Another
Test Cycle
?
No
Yes
Start
Turn Output ON and press LIMIT key.
Output First
Fail Pattern
Test
Another
Device
?
No
Yes
Stop
Press LIMIT
Yes
No
Wait for SOT pulse
from handler
Perform Source-
Measure action
Display
“
FAIL
”
Display
“
FAIL
”
Binning
Control
Binning
Control
Binning
Control
First
Failure
?
First
Failure
?
First
Failure
?
End
End
End
Yes
Yes
Yes
Output Limit 1
Fail Pattern
Immediate
Output Limit 2
Fail Pattern
Immediate
Output Limit 3
Fail Pattern
Immediate
Store Limit 1 Fail
Pattern in Memory
Store Limit 2 Fail
Pattern in Memory
Store Limit 3, 5-12 Fail
Pattern in Memory
No
No
No
Any
Failures
?
Display
“
PASS
”
Yes
Binning
Control
End
Any
Failures
?
Immediate
Output Pass
Pattern
No
Figure 11-2
Grading mode
limit testing
Содержание 6430
Страница 26: ......
Страница 32: ......
Страница 78: ...2 14 Connections ...
Страница 98: ...3 20 Basic Source Measure Operation ...
Страница 138: ...5 30 Source Measure Concepts ...
Страница 156: ...6 18 Range Digits Speed and Filters ...
Страница 168: ...7 12 Relative and Math ...
Страница 176: ...8 8 Data Store ...
Страница 202: ...9 26 Sweep Operation ...
Страница 248: ...11 22 Limit Testing ...
Страница 310: ...16 6 SCPI Signal Oriented Measurement Commands ...
Страница 418: ...17 108 SCPI Command Reference ...
Страница 450: ...18 32 Performance Verification ...
Страница 477: ...A Specifications ...
Страница 489: ...B StatusandErrorMessages ...
Страница 498: ...B 10 Status and Error Messages ...
Страница 499: ...C DataFlow ...
Страница 503: ...D IEEE 488BusOverview ...
Страница 518: ...D 16 IEEE 488 Bus Overview ...
Страница 519: ...E IEEE 488andSCPI ConformanceInformation ...
Страница 523: ...F MeasurementConsiderations ...
Страница 539: ...G GPIB488 1Protocol ...
Страница 557: ......