Keithley 2790, Справочное руководство

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Model 2790 SourceMeter
®
Switch System Reference Manual 2-39
Memory pattern command options
All CALCulate, SENSe, and UNIT subsystem commands with a <clist> (channel list)
parameter associated with Model 2790 DC volts, 2-wire ohms, and 4-wire ohms measure-
ment functions can include a memory pattern optional <clist> parameter (@Mn) that
allows you to assign those functions to specific memory pattern locations. For example,
the following command selects the 2-wire ohms measurement function for memory pat-
tern location #1:
:SENS:FUNC 'RES',(@M1)
Once various attributes are assigned to memory pattern locations, those functions will be
executed when those memory pattern locations are recalled, either individually, or while
scanning.
Memory pattern scanning
Once set up, memory patterns can be automatically scanned in the same manner as 7702
module channels.
Section 7 has complete information on scanning.
Memory patterns program example
The basic test procedure for using memory patterns to perform a series of tests on a dual-
state inflator (see
Figure 2-14 ) is shown in Table 2-5 . See Section 5 of the Model 2790
User’s Manual for more details on test procedures.
This procedure sets up nine memory locations for the following tests:
• Contact check
• Test current verification
• Bridgewire A test
• Bridgewire B test
• Shut bar A test
• Shunt bar B test
• Open circuit test voltage verification
• Insulation resistance of leakage path A
• Insulation resistance of leakage path B
After setting up memory locations, the scan is enabled, triggered, and all tests are per-
formed automatically. Readings are stored in the buffer for recall once the scan is complete.