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Model 2461 Interactive SourceMeter® Instrument Reference Manual
Section 1: Introduction
2461-901-01 A/November 2015
1-3
•
Next steps:
Contains sources of additional information.
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Maintenance:
Contains information about instrument maintenance, including line fuse
replacement and firmware upgrades.
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Common commands:
Contains descriptions of IEEE Std. 488.2 common commands.
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Status model:
Describes the Model 2461 status model.
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Converting Model 2400 code to Model 2461 code:
Provides information about converting
existing Series 2400 SCPI code to Model 2461 code.
The PDF version of this manual contains bookmarks for each section. The manual sections are also
listed in the Table of Contents at the beginning of this manual.
For more information about bookmarks, see Adobe
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Capabilities and features
The Model 2461 has the following features:
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High-resolution, five-inch touchscreen display with enhanced graphical data visualization and
on-screen debug and error histories
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Voltage source noise for 10 Hz to 20 MHz (RMS) is < 4.5 mV typical into a resistive load
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True high-current source up to 7 A (10 A pulse)
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1 A, 4 A, 5 A, and 7 A ranges
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Ability to produce individual pulses or pulse trains
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Contact check function to prevent measurement errors due to excessive resistance in test leads
when making Kelvin measurements
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High-speed source and measure digitizing
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Ability to perform sensitive measurements on low-level signals
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Higher V-sense levels, easier 4-wire configuration, and better four-point probing performance
than earlier models
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Expanded voltage, current, and resistance measurement ranges
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Simplified trigger model with source and memory configuration lists
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Front-panel USB-A connector for flash drive support; rear-panel USB-B connector for
communication, control, and data transfer
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Five front-panel banana jacks, front-panel safety earth ground, and a rear-panel screw-terminal
connector
Some additional capabilities of the Model 2461:
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Source-measure sweep capabilities (linear and logarithmic staircase sweeps)
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Four-quadrant source and sink operation
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Limit testing with a built-in comparator for pass/fail testing
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Digital I/O for stand-alone binning operations or interface to a component handler