5 OPERATION
5-20
EM210F-1
5.2.7 Image
Observation
This describes the operation for the conventional image observation assuming that the
automatic exposure mode is used (
F
Sect. 5.2.6).
1.
Prepare the specimen for observation (
F
Sects. 5.2.3d, 5.2.3e).
2.
Generate an electron beam (
F
Sect. 5.2.4).
3.
Obtain the beam on the florescent screen.
a.
Use a larger condenser aperture.
b.
Decrease the magnification.
c.
Slowly turn the BRIGHTNESS knob counterclockwise from the fully clock-
wise position.
d.
Select LOW MAG mode.
e.
Remove the specimen holder from the beam path (the holder should be left
in the goniometer).
?
Electron beam generation is impossible if the specimen holder is not in the
goniometer.
f.
Find the beam on the fluorescent screen.
g.
Place the specimen in the beam path.
4.
Depress the STD FOCUS button to set the objective lens current to the
reference value.
5.
Obtain the optimum brightness using the BRIGHTNESS knob and center the
beam position using the SHIFT knobs (L1-
⑧, R1-③
).
6.
Bring the field of view for microscopy to the screen center using control
panel SC. (
F
Sect.4.2.5).
7.
Store the specimen position if necessary on the “Specimen Position” screen
(
F
Sect. 4.4.6d).
Fig. 5.21
8.
Select the magnification to be used with the MAG-CAM L knob (R1-
⑤
).
9.
Focus the image using the OBJ FOCUS knob (R1-
⑥
).
a.
Press the florescent screen lever to place the small screen in the beam
path.
