M-2000® Hardware Manual
©2023 J.A. Woollam Co.
157
11.6
Angle of Incidence Offset
Correction
This function can be used to correct the systematic offset from the nominal
angle values of the opto-mechanical system.
Note:
This function should not be performed if there is any question in the
integrity of the System Alignment.
1.
Mount and align the 25nm SiO2/Si calibration sample.
2.
Select
Hardware
>
Controls
>
Misc
.>‘Additional Hardware Functions.’ This
will bring up a message box. Select ‘Angle Offset Correction.’
Figure 11-3. Additional Hardware Functions.
During the process, the system acquire data at angles from 45° to 85° every 10
degrees. After the measurement, the system will automatically update the
hardware.cnf file with the new offset values.
This correction may also be done with the Focusing Optics attached (if available).
The AOI range will be set based on the allowed range. The angle corrections are
separate from the unfocused corrections, so will not affect the AOI when the
Focusing Optics are removed.
11.7
System Calibration
A System Calibration is performed when the wavelengths of the instrument are
known to be incorrect or the compensator or spectrometer has been changed.
These situations occur if the M-2000 box or light source has been replaced. This
document describes the System Calibration procedure for determining the
wavelengths and compensator calibration coefficients.
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