Honeywell SmartLine ST700, Руководство пользователя

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Page 80
ST 700 Series HART/DE Option User’s Manual
Revision 4.0
Time Since
Last ET Up Method Description Time that has passed since the last time
device’s Electronics Temperature has
passed above the value of “ET Upper
Stress Limit” (in days, hours and minutes).
Set-up None.
NVM Backup once each 8 hour period
Table 22
– Minimum ET Diagnostics
Min ET Limit Parameter Description Electronics Temperature (ET) lower
operating limit from specification.
Units are same degree units as has been
selected for SV (Secondary Variable).
Set-up None.
ET Lower Limit
for Stress
Condition Description
Actual limit used in “Time Below Limit” and
“Time Since Last Event”. Value is equal to
“Min ET Limit” plus 10% of limits range.
Example
Electronics Temperature range is -40

C to
85

C for a total of 125

C.
ET Lower Stress Limit = -40

C + 10% of
125

C = -27.5

C.
Set-up None: calculation is automatic.
Min ET Value Parameter Description Lowest Electronics Temperature ever
experienced by the device.
Units are same degree units as has been
selected for SV (Secondary Variable).
Set-up None.
NVM Update every 8 hour.
Time Below
Lower Stress
Limit Parameter Description
Accumulation of minutes that device’s
Electronics Temperature has been below
the value of “ET Lower Stress Limit”.
Set-up None.
NVM Backup once each 8 hour period
Time Since
Last ET Down Method Description Time that has passed since the last time
device’s Electronics Temperature has
passed below the value of “ET Lower Stress
Limit” (in days, hours, and minutes).
Set-up None.
NVM Backup once each 8 hour period