GW Instek GSM-20H10, Руководство пользователя

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GSM-20H10 User Manual
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successful (PASS condition). If not successful (FAIL
condition), the sweep proceeds to the next memory
location in the list. With NEXT selected (the default),
the sweep proceeds to the next memory location
(present lo 1) in the list regardless of the
outcome of the test (PASS or FAIL condition).
<NRf> = 1 to 100 Specify memory location point
NEXT Next memory location point in
list (present lo 1)
Example :CALCulate2:CLIMits:PASS:SMLocation 1
Command :CALCulate2:CLIMits:PASS:SMLocation?
Function
Query “pass” source memory location
Example :CALCulate2:CLIMits:PASS:SMLocation?
Command :CALCulate2:CLIMits:BCONtrol <name>
Function
This Command is used to control when the digital
output will update to the pass or fail bit pattern. The
pass or fail bit pattern tells the handler to stop the
testing process and place the DUT in the appropriate
bin.
With IMMediate selected, the digital output will
update immediately to the bit pattern for the first
failure in the testing process. If all the tests pass, the
output will update to the pass bit pattern.
With END selected, the digital output will not update
to the pass or fail bit pattern until the GSM completes
the sweep or list operation.
This allows multiple test cycles to be performed on
DUT. With the use of a scanner card, multi-element
devices (i.e. resistor netoperate) can be tested. If, for
example, you did not use END and the first element in