FISCHER FISCHERSCOPE X-RAY 5000 Series, Руководство оператора

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166 WinFTM
®
Features of WinFTM BASIC and LIGHT Material Analysis
With the LIGHT version max. 4 or 5 individual parameters of a specimen can be measured
(thickness: 4 elements, composition: 5 elements).
Examples:

A component is to be measured that has 4 layers each consisting of one element.

A component is to be measured that has one coating, which consists of a mixture of 5
elements.
Even individual elements, which may occur several times in different coatings of the
coating system, can be measured.
2.4 Material Analysis

Quantitative material analysis of complex layers. Individual layers may consist of
several elements. The total number of measured quantities amounts up to 24 with
WinFTM BASIC and 4 with WinFTM LIGHT.

Quantitative analysis of solid, powder or paste materials as well as solutions for up to
24 elements. The range of analyzable elements depends on the detector (see Techni-
cal Data Sheet).

Even buried layers can be analyzed.

Analysis with balance: It is not required to completely define the composition of the
specimen by 100 percent. The analysis is performed by matching the peak areas, with-
out the need for the sum of concentrations amounting to 100 percent. Applicable for
recycling, analysis of trace elements in plastics, soil specimens, biological specimens
and non-homogeneous composites.
2.5 Direct Analysis in the Spectrum

Solid specimens with unknown compositions can be easily analyzed in the spectrum
mode of WinFTM. Instead of defining the composition via Def.MA, only the relevant
elements need to be highlighted. A calibration is not necessary. Specimens can con-
sist of a maximum of 24 elements with WinFTM BASIC or 5 elements with WinFTM
LIGHT.

Matrix effects and cross-excitation are taken into account.

The residual is displayed. The residual is the spread between the calculated sum spec-
trum and the measured spectrum. You receive references to a potentially wrong selec-
tion of the elements to be measured.
The direct analysis is not feasible for the analysis of light elements, solutions or coating
systems.