SS500XP/SS2000XP Gas Analyzer
BA02183C
1
–
4
Hauser
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About the Gas Analyzers
The SS500XP/SS2000XP are tunable diode laser (TDL) absorption
spectrometers operating in the near- to short-wavelength infrared. Each
compact sensor consists of a TDL light source, sample cell and detector
specifically configured to enable high sensitivity measurement of a particular
component within the presence of other gas phase constituents in the stream.
The sensor is controlled by microprocessor-based electronics with embedded
software that incorporates advanced operational and data processing
algorithms.
A sample conditioning system may also be included with the system that has
been specifically designed to deliver an optimum sample stream that is
representative of the process systems stream at the time of sampling. Most
SS500XP/SS2000XP analyzer systems are configured for use at extractive
natural gas sampling stations.
Differences between the SS500XP and SS2000XP
The SS500XP and SS2000XP are single-channel analyzers used predominantly
for measuring H
2
O or CO
2
in pipeline natural gas. The SS2000XP is a higher
resolution version of the SS500XP (for performance specifications, see
Table A–1 on page A–1 for the SS500XP or Table A–2 on page A–2 and
Table A–3 on page A–7 for the SS2000XP).
How the Analyzers Work
The SS500XP/SS2000XP analyzers employ tunable diode laser absorption
spectroscopy (TDLAS) to detect the presence of trace substances in process
gases. Absorption spectroscopy is a widely used technique for sensitive trace
species detection. Because the measurement is made in the volume of the gas,
the response is much faster, more accurate and significantly more reliable than
traditional surface-based sensors that are subject to surface contamination.
In its simplest form, a diode laser absorption spectrometer typically consists of
a sample cell with a mirror at one end, and a mirror or window at the opposite
end, through which the laser beam can pass. Refer to Figure 1–1. The laser
beam enters the cell and reflects off the mirror(s) making one or more trips
through the sample gas and eventually exiting the cell where the remaining
beam intensity is measured by a detector. With the SS500XP/SS2000XP
Содержание SS2000XP
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