ADXRS450 - UG
Evaluation Board User Guide
Rev. 0 | Page 10 of 17
TEMPERATURE TEST
Figure 19: Temperature Test Panel
The next panel is designed to let the user easily perform long
term testing at a reduced bandwidth and data rate. The panel is
specifically designed for temperature testing, with the on board
temperature sensor output plotted alongside the device’s
RateOut, Filtered Self Test and Quadrature. Each data point is
comprised of an average of 250samples, gathered at a 500Hz
data rate, resulting in a 2Hz data rate from the device. The user
is able to both view and record this information, in much the
same way as the “View and Record” panel allowed. Data is
again streamed to a file, to allow for an indefinite length for data
recording.
Before recording the data on this panel, if the user wishes to
adjust for any null offset components, then this option is again
made available to the user. Note that any offset correction made
to the ADXRS450 is stored in the device’s EEPROM indefinitely,
or until over written with a subsequent correction value. In this
sense, any null offset corrections made on the View and Record
Data panel will persist throughout the remainder of the
evaluation GUI, even as the device is power cycled.
Supplemental information, including the fault register, sequence
bits, and status bits are all graphically indicated to the user, and
are recorded in addition to the plotted information when the
user opts to record the data.
