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Agilent InfinityLab LC Series Diode Array Detectors User Manual
141
8
Test Functions and Calibration
Slit Test
Figure 44 Slit Test – Signal
Test Failed
Slit Test Evaluation
Probable cause
Suggested actions
1
Air bubble in Max-Light Cartridge Cell.
Flush the flow cell or use the Max-Light Cartridge
Test Cell.
2
Old lamp.
Run the “Intensity Test”. Exchange the lamp if old
or defective.
3
Defective slit assembly.
Please contact your Agilent service representa
-
tive.
4
Defective detector main board.
Please contact your Agilent service representa
-
tive.
5
Defective optical unit.
Please contact your Agilent service representa
-
tive.