Agilent Technologies E5070B, Руководство пользователя

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Chapter 16 561
Specifications and Supplemental Information
Storage
16. S
pecifica
tions and
Su
pple
m
en
ta
l Infor
m
ation
Storage
Internal hard disk drive Store and recall instrument states, calibration data, and trace data on 3
GB, minimum, internal hard drive. Trace data can be saved in CSV
(comma separated value) format. All files are MS-DOS
®
-compatible.
Instrument states include control settings, limit lines, segment sweep
tables, and memory trace data.
File sharing Internal hard disk drive (D:) can be accessed from an external
Windows
®
PC through LAN. And The hard disk drive of an external
Windows
®
PC can be accessed from the analyzer through LAN.
Disk drive Instrument states, calibration data, and trace data can be stored on an
internal 3.5 inch 1.4MB floppy disk in MS-DOS
®
-compatible format.
Screen hardcopy Printouts of instrument display are directly produced on a printer. The
analyzer provides USB and parallel interfaces.
System capabilities
Familiar graphical user interface The ENA Series analyzer employs a graphical user interface based on
the Windows
®
operating system. There are three ways to operate the
instrument manually: you can use a hardkey interface, a touch screen
interface (Opt. 016), or a mouse interface.
Limit lines Define the test limit lines that appear on the display for pass/fail testing.
Defined limits may be any combination of horizontal/sloping lines and
discrete data points.
Fixture Simulator
Balanced-unbalanced conversion Convert data from single-ended measurement to balanced measurement
parameters (mixed-mode S-parameters), balance parameter or CMRR
by using internal software.
Network De-embedding De-embed an arbitrary circuit defined by a two-port Touchstone data file
for each test port. This function eliminates error factors between the
calibration plane and DUT and expands the calibration plane for each
test port. This function can be used with the port extension function.
4-port Network Embedding/De-embedding Embed or de-embed an arbitrary circuit defined by a four-port
Touchstone data file.
Port reference impedance conversion Convert S-parameters measured in 50
Ω
reference impedance to data in
other reference impedance levels by using internal software. This
conversion can be performed for both single-ended (unbalanced)
measurement ports and converted balanced measurement ports.
Matching circuit Add one of the predefined matching circuits or a circuit defined by a
two-port Touchstone data file to each single-ended test port or converted
balanced (differential) test port by using internal software.