ON Semiconductor NCN8024GEVB Series, User Manual

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Semiconductor Components Industries, LLC, 2012
June, 2012 − Rev. 0
1 Publication Order Number:
EVBUM2127/D
NCN8024GEVB Series
NCN8024
SOIC-28 & TSSOP-28
Evaluation Board
User's Manual
Introduction
This document gives a detailed description of the
NCN8024 Evaluation Boards (SOIC − 28 & TSSOP − 28
versions) with the Bill Of Material (BOM), board schematic
and layout. The appropriate lab test setup is also provided.
The NCN8024 Evaluation Boards have been designed to
help for a quick evaluation of the NCN8024 Smart card
interface device.
This document has to be used with the NCN8024
datasheet. The datasheet contains full technical details
regarding the NCN8024 specifications and operation. The
board (FR4 material) is implemented in two metal layers.
The top and Bottom layers have thicknesses of 35
m m. The
PCB thickness is 1.6 mm with dimensions of 100 mm by
74 mm (see Figure 1).
These evaluation boards can be used to evaluate the device
performance.
Figure 1. Evaluation Boards − SOIC − 28 & TSSOP − 28
Table 1. EQUIPMENT
Description Main Features Example of Equipment (Note 1) Qty
Regulated Power Supply 200 mA DC Current Capability Tektronix PS2520G 2
Multimeter Keitley 2000 or 2001 2
Sourcemeter Keitley 2400 1
Oscilloscope 500 MHz Bandwidth, Four Channel Scope,
Min 1 Mbit Memory per Channel (Note 2)
Tecktronix TDS744, 754 or 784/TDS5054
Series or Lecroy WR5060 TDS5104B,
1 GHz, 5GS/s
1
Voltage Probe 4 Probes 500 MHz Bandwidth Tektronix or Lecroy 4
Waveform Generator Pattern Genarator Agilent 81104A 80 MHz or HP8110A
150 MHz 2 Outputs
1
SMB Cable External Clock Input 1
1. Equipment used in the context of this Application Note Manual.
2. Greater Scope memory per channel offers better resolution.
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