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Semiconductor Components Industries, LLC, 2012
June, 2012
−
Rev. 0
1
Publication Order Number:
EVBUM2127/D
NCN8024GEVB Series
NCN8024
SOIC-28 & TSSOP-28
Evaluation Board
User's Manual
Introduction
This document gives a detailed description of the
NCN8024 Evaluation Boards (SOIC
−
28 & TSSOP
−
28
versions) with the Bill Of Material (BOM), board schematic
and layout. The appropriate lab test setup is also provided.
The NCN8024 Evaluation Boards have been designed to
help for a quick evaluation of the NCN8024 Smart card
interface device.
This document has to be used with the NCN8024
datasheet. The datasheet contains full technical details
regarding the NCN8024 specifications and operation. The
board (FR4 material) is implemented in two metal layers.
The top and Bottom layers have thicknesses of 35
m
m. The
PCB thickness is 1.6 mm with dimensions of 100 mm by
74 mm (see Figure 1).
These evaluation boards can be used to evaluate the device
performance.
Figure 1. Evaluation Boards
−
SOIC
−
28 & TSSOP
−
28
Table 1. EQUIPMENT
Description
Main Features
Example of Equipment
(Note 1)
Qty
Regulated Power Supply
200 mA DC Current Capability
Tektronix PS2520G
2
Multimeter
Keitley 2000 or 2001
2
Sourcemeter
Keitley 2400
1
Oscilloscope
500 MHz Bandwidth, Four Channel Scope,
Min 1 Mbit Memory per Channel (Note 2)
Tecktronix TDS744, 754 or 784/TDS5054
Series or Lecroy WR5060 TDS5104B,
1 GHz, 5GS/s
1
Voltage Probe
4 Probes 500 MHz Bandwidth
Tektronix or Lecroy
4
Waveform Generator
Pattern Genarator
Agilent 81104A 80 MHz or HP8110A
150 MHz 2 Outputs
1
SMB Cable
External Clock Input
1
1. Equipment used in the context of this Application Note Manual.
2. Greater Scope memory per channel offers better resolution.
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EVAL BOARD USER’S MANUAL
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