LANGER EMV-Technik E 1 User Manual Download Page 1

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2016.08.15. E1 user manual

User manual

Immunity development system

E 1

How to make a DUT immune to interference

through measurement and modification at the development stage

Dipl.- Ing. Gunter Langer

Nöthnitzer Hang 31

01728 Bannewitz

10.04.2014

Summary of Contents for E 1

Page 1: ...ser manual Immunity development system E 1 How to make a DUT immune to interference through measurement and modification at the development stage Copyright C Dipl Ing Gunter Langer N thnitzer Hang 31...

Page 2: ...asurement strategies for interference suppression in a device under test 17 5 1 Analysis of the interference current paths 19 5 1 1 Basic principle of magnetic coupling two pole injection into the DUT...

Page 3: ...by the standard burst generator in accordance with the standard are injected into the supply lines of the device under test and flow back to the generator via ground The paths on which the pulse shap...

Page 4: ...ption of the E1 components The E1 immunity development system comprises a SGZ 21 pulse density burst generator an S31 optical sensor an MS 02 magnetic field probe with optical fibre output magnetic an...

Page 5: ...a visible width of 50 ms Burst output symmetric output galvanically isolated from ground Counter s optical fibre input input socket for 2 2 mm plastic optical fibre The power supply is located on the...

Page 6: ...21 counter via an optical fibre and the optical input The received light pulses are initially displayed by the Signal and the Spike LEDs and then counted by the counter The counter s peak time is 1 s...

Page 7: ...n the right 2 1 4 Preparing the SGZ 21 as a pulse density counter and for signal monitoring The optical fibre has to be inserted into the input up to the limit stop and fastened with the knurled screw...

Page 8: ...E field probes have to be used to localise these weak points Apart from conductor run sections high resistance components such as pull up resistors or quartz generators may also prove critical in this...

Page 9: ...to couple disturbance current into selected individual conductor runs IC pins SMD devices and thin lines ribbon cable A module often has several insensitive and only a few sensitive signal connection...

Page 10: ...e areas The probe is ideal for applying an electric field to extensive or line shaped weak points with a size of 5 to 10 cm and ranks between the ES 02 and ES 00 field sources please refer to the corr...

Page 11: ...t signals from the sensor are transmitted to the LWL counter input of the SGZ 21 via an optical fibre The level changeover switch allows the signal to be negated The sensor can be used in two differen...

Page 12: ...The circuit ensures that fault states are transmitted from the device under test 2 3 1 Principal mode of operation of the sensor The sensor is integrated in the device under test and connected to the...

Page 13: ...lse density method Chapter 3 Figure 10 Measuring a magnetic field with the MS 02 probe Fields which penetrate the probe s induction coil in the orthogonal direction induce a voltage Fields whose direc...

Page 14: ...u1 This is n 11 pulses in the example If the device under test has a higher immunity level u3 for example n 3 pulses will exceed the immunity level The number of pulses which exceed the immunity level...

Page 15: ...etic field B The burst related magnetic field induces a disturbance voltage in the inserted enamelled copper wire loop which becomes effective on the S31 sensor input A light pulse is triggered when t...

Page 16: ...l line In the SGZ 21 the pulse sequence is not ordered as a ramp according to the amplitude as shown in Figure 12 rather the amplitude u of the pulse sequence is distributed stochastically Figure 16 T...

Page 17: ...ny differences Which differences result from modifying the cable position for example Do other faults occur less frequently for example along with the known malfunctions After this initial analysis of...

Page 18: ...pacitively via an electric field an electric disturbance field is generated on the surface of the printed circuit board An electric field is also generated at galvanic isolating points in the device u...

Page 19: ...triggered in the device under test Individual sections of the device under test such as individual modules individual cable connections small areas of a large module etc are initially investigated 5...

Page 20: ...sformer or opto coupler and returned via the secondary side Take appropriate protective measures when working with voltages of more than 42 V Both generator outputs are connected to the device under t...

Page 21: ...to be removed from the device and arranged with their original connections alongside each other The printed circuit boards can be unfolded directly and are then easily accessible if they are flexibly...

Page 22: ...ole closes the generator circuit to ground of the printed circuit board Figure 23 If the disturbance current is injected via a printed circuit board the generator poles are connected to the board s gr...

Page 23: ...suitable points are available in the device under test to connect the generator Figure 28 Figure 27 Injection of disturbance current via a two pole connection and the connector of two modules Contact...

Page 24: ...ntensity rises substantially The module is subjected to a higher local load Test set up for case 1 The disturbance current from the generator enters the device under test by conductive coupling via th...

Page 25: ...age differences generate electric fields which act on the surface of the module High resistance networks with pull up or pull down resistors in the range of 1 10 k are especially sensitive to these el...

Page 26: ...hese conditions 5 2 Localisation of weak points with field sources It is not the disturbance current or disturbance voltage that is directly responsible for interference but the electric or magnetic f...

Page 27: ...enerates the magnetic flux density B t or the magnetic flux t The flux t induces voltage pulses in the conductor loops The magnetic field enclosed by the conductor loop is responsible for voltage indu...

Page 28: ...wn circuits with resistances in the k range Figure 34 Principle of electric coupling to conductor loops The coupling electrode formed by the conductor run has an outer capacitance per unit length whic...

Page 29: ...or loops which are responsible for a certain fault pattern A disturbance voltage can only be induced in a large conductor loop with field sources that can generate a field beam of a similar size The B...

Page 30: ...e s surface for magnetic coupling Figure 38 Only small surface areas are usually sensitive to magnetic fields The field source has to be swivelled and turned to find these sensitive conductor loops wi...

Page 31: ...affected signal lines is sensitive to magnetic fields The BS 05DU magnetic field probe can then be used for a more precise selection of individual lines BS 04DB couples a magnetic field to ground betw...

Page 32: ...d voltages cause malfunctions BS 05DU couples a magnetic field to an IC pin to test whether the induced voltages cause malfunctions Each pin can be tested individually This allows the developer to com...

Page 33: ...ground system has large scale weak points BS 02 couples a magnetic field to a U shaped ground system to test whether the field affects lines located outside the ground system BS 02 couples a magnetic...

Page 34: ...can then be precisely localised Should this adjustment prove insufficient the PULSE SHAPE toggle switch Figure 2 can be changed over to wide pulse so as to attenuate the interference effect The inten...

Page 35: ...o small lines components or IC pins The electric field source with its field is guided directly across the module s surface for electric coupling Figure 41 Only small surface areas are usually sensiti...

Page 36: ...is sensitive to electric fields The ES 05D electric field probe is then used for a more precise selection of the individual lines ES 02 couples an electric field to the ground system of a printed cir...

Page 37: ...d circuit board If the conductor runs are very close to each other in a bundle it may not be possible to find out exactly which conductor run is the sensitive one The developer thus has to find a poin...

Page 38: ...itive to electric fields The IC s oscillator cells and PLL cells are usually E field sensitive ES 08D E field sources Use ES 02 couples an electric field to a conductor run to investigate whether a ma...

Page 39: ...als from the module have to be monitored to obtain more information about the device under test such as reset chip select watchdog or any other life signs The E1 offers the possibility of indicating s...

Page 40: ...exceeded is signalled directly via an optical fibre The line in the device under test may be an original conductor run or an artificial signal line made of wire which has been inserted for this purpos...

Page 41: ...he device under test Two strategies can be implemented 1 Constant signals reset are monitored which change if a fault occurs The change is transmitted to the SGZ 21 via an optical fibre and indicated...

Page 42: ...t The MS 02 magnetic field probe can be used to measure burst related magnetic fields in the device under test The magnetic field probe is galvanically isolated by an optical fibre to prevent interact...

Page 43: ...disturbance current will flow via the ground system and the respective magnetic field depends on the form of the ground system Figure 46 shows the current flow and the respective magnetic field If th...

Page 44: ...ence emissions may occur when operating the SGZ 21 and especially when using the test set ups described in this manual The user is responsible for taking measures to prevent any interference to the co...

Page 45: ...ensions WxDxH 154x100x62 mm Pulse parameters Rise time approx 2 ns Tail time approx 10 ns Peak values approx 0 1500 V evenly distributed Pulse interval approx 1 ms Output symmetric galvanically isolat...

Page 46: ...Magnetic field source BS 02 1 09 Magnetic field source BS 04DB 1 10 Magnetic field source BS 05DU 1 11 Magnetic field source BS 05D 1 12 Electric field source ES 00 1 13 Electric field source ES 01 1...

Page 47: ...lso comprises three different exchangeable probe heads which can be used for different tasks Figure 49 such as measuring pin related magnetic fields and disturbance currents on ICs and on individual c...

Page 48: ...r the influence of disturbances Figure 50 Figure 50 Test set up with two channel optical signal acquisition to produce an oscillogram of the disturbed device under test This document may not be copied...

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