Hardware Development Guide of Module Product
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MF206A
Table 8–3 Testing Instrument & Device
Testing Item
Instrument & Device
RF test
Comprehensive testing device
RF cable
Tower antenna
Microwave darkroom
High/Low-temperature
running & storage test
High/Low-temperature
experimental box
Temperature shock test
Temperature shock
experimental box
Vibration test
Vibration console
8.3
Reliability Testing Environment
The reliability test includes the vibration test, high/low-temperature running, high/low-temperature storage and
temperature shock experiment test. Refer to Table 8-4 for the specific parameters.
Table 8–4 Reliability Features
Test Item
Test Condition
Test Standard
Random vibration
Frequency range: 5-20Hz, PSD:1.0m2/s3
Frequency range: 20-200Hz, -3dB/oct
3 axis, 1 hour for each axis
IEC 68-2-6
Temperature shock
Low temperature: -40°C ±2°C
High temperature: +80°C ±2°C
Temperature changing period: less than
30seconds
Test duration: 2 hours
Cycle: 10
IEC 68-2-14 Na
High-temperature
running
Normal high temperature: 75 °C
Extreme high temperature: 85°C
Duration: 24 hours
ZTE standard
Low-temperature
running
Normal low temperature: -30°C
Extreme low temperature: -40°C
Duration: 24 hours
ZTE standard