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W632GG6KB
Publication Release Date: Jan. 03, 2017
Revision: A06
- 122 -
10.13
I
DD
and I
DDQ
Specification Parameters and Test Conditions
10.13.1 I
DD
and I
DDQ
Measurement Conditions
In this section, I
DD
and I
DDQ
measurement conditions such as test load and patterns are defined.
Figure 105 shows the setup and test load for I
DD
and I
DDQ
measurements.
I
DD
currents
(such as I
DD0
, I
DD1
, I
DD2N
, I
DD2NT
, I
DD2P0
, I
DD2P1
, I
DD2Q
, I
DD3N
, I
DD3P
, I
DD4R
, I
DD4W
,
I
DD5B
, I
DD6
, I
DD6ET
and I
DD7
) are measured as time-averaged currents with all V
DD
balls of the
DDR3 SDRAM under test tied together. Any I
DDQ
current is not included in I
DD
currents.
I
DDQ
currents
(such as I
DDQ2NT
and I
DDQ4R
) are measured as time-averaged currents with all
V
DDQ
balls of the DDR3 SDRAM under test tied together. Any I
DD
current is not included in I
DDQ
currents.
Attention: I
DDQ
values cannot be directly used to calculate IO power of the DDR3 SDRAM.
They can be used to support correlation of simulated IO power to actual IO power as
outlined in Figure 106. In DRAM module application, IDDQ cannot be measured separately
since V
DD
and V
DDQ
are using one merged-power layer in Module PCB.
For
IDD
and I
DDQ
measurements, the following definitions apply:
“0” and “LOW” is defined as V
IN
≤ V
ILAC(max)
.
“1” and “HIGH” is defined as V
IN
≥ V
IHAC(min)
.
“MID-LEVEL” is defined as inputs are V
REF
= V
DD
/ 2.
Timings used for I
DD
and I
DDQ
Measurement-Loop Patterns are provided in Table 38.
Basic I
DD
and I
DDQ
Measurement Conditions are described in Table 39.
Detailed I
DD
and I
DDQ
Measurement-Loop Patterns are described in Table 40 through Table 47.
I
DD
Measurements are done after properly initializing the DDR3 SDRAM. This includes but is not
limited to setting
RON = RZQ/7 (34 Ohm in MR1);
Qoff = 0
b
(Output Buffer enabled in MR1);
Rtt_Nom = RZQ/6 (40 Ohm in MR1);
Rtt_WR = RZQ/2 (120 Ohm in MR2);
Attention:
The I
DD
and I
DDQ
Measurement-Loop Patterns need to be executed at least one time
before actual I
DD
or I
DDQ
measurement is started.
Define D = {CS#, RAS#, CAS#, WE# } := {HIGH, LOW, LOW, LOW}
Define D# = {CS#, RAS#, CAS#, WE# } := {HIGH, HIGH, HIGH, HIGH}
Table 38
– Timings used for IDD and IDDQ Measurement-Loop Patterns
Speed Bin
DDR3-1333
DDR3-1600
DDR3-1866
Unit
CL-nRCD-nRP
9-9-9
11-11-11
13-13-13
Part Number Extension
-15/15I
-12/12I
-11
tCK
1.5
1.25
1.07
nS
CL
9
11
13
nCK
nRCD
9
11
13
nCK
nRC
33
39
45
nCK
nRAS
24
28
32
nCK
nRP
9
11
13
nCK
nFAW
30
32
33
nCK
nRRD
5
6
6
nCK
nRFC 2 Gb
107
128
150
nCK