MEASURES, LOGIC STATES AND COUNTERS
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NA016 - Manual - 05 - 2022
• Date and time (S-Year)
• Data e ora (S-Year)
• Data e ora (S-Month)
• ...
• Data e ora (S-Millisecond)
• Event cause (E-Cause)
Setting changes - Settings
Any change on the following parameters are stored:
• Output relays (function, logic and mode).
• CB position monitoring enabling.
• TCS enabling.
• Threshold changes.
Ten events are recorded into a circular FIFO (First In, First Out) buffer.
[1]
Following information are stored in every record (
Read \ Faults \ Info
menu):
• Fault counter (Setting stored)
[2]
• Last setting
Following information are stored (
Read \ Settings \ Setting
menu):
• S-Number counter
• S-I>Curve
• S-I>inv (I>threshold)
• S-t>inv (I> operate time)
• S-I>>def (I>> threshold)
• S-t>>def (I>> operate time)
• S-I>>>def (I>>> threshold)
• S-t>>>def (I>>> operate time)
• S-IE>def (IE> threshold)
• S-tE>def (IE> operate time)
• S-IE>>def (IE>> threshold)
• S-tE>>def (IE>> operate time)
• S-CB Diagnostic
• S-74 TCS
• S-K1 (K1 assignment)
• S-K1 logic (K1 logic)
• S-K1 mode (K1 mode)
• S-K2 (K2 assignment)
• .....
• S-Year (Date)
• S-Month (Date)
• ...
• S-Second (Time)
Info
• Code
NA016-a
• Serial ......
(Serial number)
• Firmware release ...... (eg: 2.00)
• Nominal freq.
(eg: 50 or 60 Hz)
• Firmware release ...... (ef: 1.00)
• Protocol release ...... (eg: 1.00)
Protections trip
• Protections trip
(eg: Trip I>>)
Self-test
Following information are available (
Read \ Self test \ Info
menu):
• Type
• Self-test cause
• Self-test latch
The relay self-test function classifies relay operational anomalies according to three levels:
- MINOR ANOMALY: The device continues to function within the possible limits with the protective
devices activated;
- MAJOR ANOMALY: Operation of the device may be corrected by the operator by resetting the
initial (default) configuration and hence the desired settings;
- FATAL ANOMALY: All logic and protective functions are inoperative and the relay must be returned
to the factory.
The internal self-test function is capable of detecting the following anomalies and indicating them
by means of messages:
- defective auxiliary power supply (FATAL ANOMALY);
- output relay coil breakage (FATAL ANOMALY);
- alteration of the calibration data stored in EEPROM memory (FATAL ANOMALY);
- alteration of the parameters (threshold setting, times, relays… etc.) in EEPROM memory (MAJOR
ANOMALY);
Note 1 The last change on settings ia stored inside memory addressed by the Last setting (1...10) parameter
Note 2 Counter is updated at any new record; it may be cleared by means ThyVisor
