THORLABS M2MS, Operating Manual

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BP209 Series 1 General Information
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21424-D02
1 General Information
The BP209 Series Thorlabs Dual Scanning Slit Beam Profilers are ideal for analyzing cross
sectional profiles of near-Gaussian laser beams and can be operated in scanning-slit or knife-
edge modes. The beam diameter is measured in accordance with the ISO 11146 standard and
can be displayed using a number of industry-standard clip levels or an arbitrary clip level set by
the user. When the beam of interest does not have a near-Gaussian beam shape, or when
single-shot measurements of pulsed beams are required, we recommend the Thorlabs
BC207
CMOS Camera Beam Profilers .
With the BP209 beam profiler, measurements of the intensity profiles along the user-specified
X and Y axes of the beam's cross section are acquired at scan rates between 2 Hz and 20 Hz,
Scan rates can bet set in the Beam Software. The fast 20 Hz scan rate enables real-time op-
tical system alignment. Primarily intended for CW laser beams, >10 Hz pulsed beams can also
be measured using an averaging technique.
These measurements can be used for beam quality evaluation, examination of the reconstruc-
ted beam profile, and monitoring long-term stability.
Three BP209 Dual Scanning Slit beam profiler models are available with different wavelength
ranges: BP209-VIS(/M), BP209IR1(/M), and BP209-IR2(/M). Each can be purchased as a met-
ric or imperial version. For the purpose of this manual, the versions are referred to a
BP209xxx(/M).
The Beam Software versions 8.0 and higher support the BP209 Beam Profiler. The Beam Soft-
ware is provided for download from the software tab on the
Thorlabs website .
To convert Thorlabs beam profilers into a M² measurement system, Thorlabs offers the M2MS(-
AL) extension sets . For more information please visit the Thorlabs website.
1.1 Ordering Codes and Accessories
BP209-VIS Slit Beam Profiler, 200 - 1100 nm, 9 mm aperture, 5 and 25 µm slits,
imperial version
BP209-VIS/M
Slit Beam Profiler, 200 - 1100 nm, 9 mm aperture, 5 and 25 µm slits,
metric version
BP209IR1 Slit Beam Profiler, 500 - 1700 nm, 9 mm aperture, 5 and 25 µm slits,
imperial version
BP209IR1/M
Slit Beam Profiler, 500 - 1700 nm, 9 mm aperture, 5 and 25 µm slits,
metric version
BP209-IR2 Slit Beam Profiler, 900 - 2700 nm, 9 mm aperture, 5 and 25 µm slits,
imperial version
BP209-IR2/M
Slit Beam Profiler, 900 - 2700 nm, 9 mm aperture, 5 and 25 µm slits,
metric version