Description
3
SLUUBS2A – November 2017 – Revised December 2017
Copyright © 2017, Texas Instruments Incorporated
UCC21220EVM-009
2
Description
The UCC21220EVM-009 evaluation board has independent connection points for VCCI, VDDA, and
VDDB supplies, including separate ground points. Three-position headers with jumpers for all the key
input signals, such as PWM inputs (INA, INB, or PWM) and the disable function (DIS), let designers easily
evaluate different protection functions. A variety of testing points support most of the key-feature probing
of the UCC21220 device. Moreover, the PCB layout is not only optimized with minimized loop area in each
gate driver loop and power supply loop with bypassing capacitors, but it also supports high voltage testing
between the primary side and secondary side, with a 40-mil PCB board cutout. Importantly, the creepage
distance between two output channels is maximized with a TO252-2 (DPAK) bootstrap diode, which
facilitates high-voltage, half-bridge testing for a wide variety of power converter topologies. For detailed
device information, see the
UCC21220 4-A/6-A, Dual Channel Isolated Gate Driver
data sheet and
Isolated Gate Driver Solutions
, from TI.
2.1
Features
•
Evaluation module for UCC21220 in SOIC-16 (D) package
•
3-V to 5-V VCCI power supply range, with up to 18-V VDDA/VDDB power supply range
•
4-A source and 6-A sink current capability
•
3-kV
RMS
isolation for 1 minute per UL 1577
•
TTL/CMOS compatible inputs
•
3-position header for INA, INB, and DIS pins
•
PCB layout optimized for power supply bypassing capacitors, gate driver loop
•
PCB board cutout facilitates high-voltage isolation test between primary side and secondary side
•
Maximized creepage distance between two output channels
•
Support half-bridge test with MOSFETs, IGBTs, and SiC MOSFETs, with connection to external power
stage
•
Testing points allow probing all the key pins of the UCC21220 device and other SOIC-16 ISO driver
parts
