Software
15
SLDU031 – December 2017
Copyright © 2017, Texas Instruments Incorporated
PGAxxxEVM-037 Pressure Sensor Signal Conditioner Evaluation Module
4.4.3
RAM Memory Built-In Self Test
A RAM Memory Built-In self test is available to ensure the RAM of the PGAxxx device is functioning
properly. The user can select one or more algorithms to test the memory. Once the test is begun by
clicking the
START
button, the GUI will initiate each selected test in turn, and will report once all tests are
complete and if the any of the tests were failed.
4.5
Analog Front End Page
The analog front end panel allows the user to configure the AFE portion of the PGAxxx device in an easy-
to-use block diagram format (shown in
) as an initial test and debug measure. These same
settings are available in the
PGA302 EEPROM Settings
page (PGA302 EVM GUI only), however the
settings made in the
Analog Front End
page will not carry over to the EEPROM settings page, and they
must be repopulated in order to program the EEPROM for future use.
