EEM19
EEM Module
Category
Debug
Function
DMA may corrupt data in debug mode
Description
When the DMA is enabled and the device is in debug mode, the data written by the DMA
may be corrupted when a breakpoint is hit or when the debug session is halted.
Workaround
This erratum has been addressed in MSPDebugStack version 3.5.0.1. It is also available
in released IDE EW430 IAR version 6.30.3 and CCS version 6.1.1 or newer.
If using an earlier version of either IDE or MSPDebugStack, do not halt or use breakpoints
during a DMA transfer.
Note
This erratum applies to debug mode only.
EEM23
EEM Module
Category
Debug
Function
EEM triggers incorrectly when modules using wait states are enabled
Description
When modules using wait states (USB, MPY, CRC and FRAM controller in manual mode)
are enabled, the EEM may trigger incorrectly. This can lead to an incorrect profile counter
value or cause issues with the EEMs data watch point, state storage, and breakpoint
functionality.
Workaround
None.
Note
This erratum affects debug mode only.
LCDB5
LCDB Module
Category
Functional
Function
Static DC charge can built up on dedicated COMx pins.
Description
If the device is set into LPMx.5, its dedicated COMx pins (not shared with GPIO function)
are floating. External leakage paths to these pins can result in dedicated COMx pins being
charged. This can lead to static DC voltages being applied to the external LCD display.
This might cause long term over-stress to the LCD display and/or cause certain LCD
segments to flare up when device wakes up from LPMx.5 mode.
Workaround
Connect a high-resistance resistor between the dedicated COM pins and Vss to
permanently discharge the affected pins.
LCDB6
LCDB Module
Category
Functional
Function
LCD outputs may be corrupted by modifying register fields VLCDx and/or LCDCPEN of
LCDCVCTL register while LCDON (LCDCCTL0) is set
Advisory Descriptions
12
MSP430FG6426 Microcontroller
SLAZ669P – MAY 2015 – REVISED AUGUST 2021
Copyright © 2021 Texas Instruments Incorporated
