TSW1250 GUI
Figure 13. Verifying With Ramp Test Pattern
•
Now, disable the Ramp Test Pattern in the ADS5263 GUI.
•
This completes the verification of the ramp test pattern.
4.3
Verify With a Sine Wave Analog Input
•
Note that for all performance evaluation, low-phase noise signal generators are required (see
)
for both analog signal and sampling clock inputs.
•
In the TSW GUI,
–
Enter the ADC input frequency being applied. For example, 3M for 3-MHz input frequency.
–
choose the desired channel
•
Set the frequency in the signal generator to the value displayed in the field ADC Input Coherent
frequency and connect the generator output to the desired channel.
This makes the input signal coherent with respect to the sampling clock, which is required for FFT
analysis.
•
Now, press the Capture button, and check the overlay unwrap waveform button.
•
The time domain graph shows the captured sine wave data.
15
SLAU344
–
May 2011
ADS5263EVM Evaluation Module
Copyright
©
2011, Texas Instruments Incorporated