Tektronix DSA8300, Programmer'S Manual

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Commands Listed in Alphabetical Order
MEASUrement:MEAS<x>:NOISe
This command sets or queries whether the noise measurement is made on the high
or low level of the waveform. Sending this command is equivalent to selecting
High or Low for the Noise At
fi eld in the Eye section of the Region tab in the
Measurement Setup dialog box. The Eye section is displayed only if you have an
eye-pattern or optical measurement de
fi ned.
Group Measurement
Syntax
MEASUrement:MEAS<x>:NOISe {HIGH | LOW}
MEASUrement:MEAS<x>:NOISe?
Arguments
HIGH
causes the measurement for noise to be taken at the high level of the
waveform.
LOW
causes the measurement for noise to be taken at the low level of the
waveform.
Examples
MEASUREMENT:MEAS1:NOISE HIGH
causes the noise measurement to be made
at the high level of the waveform for Measurement 1.
MEASUREMENT:MEAS2:NOISE?
might return
MEASUREMENT:MEAS2:NOISE
LOW
, indicating that Measurement 2 will measure noise at the low level of the
waveform.
MEASUrement:MEAS<x>:REFLevel<x>? (Query Only)
This is a query only command that returns all reference level <x> settings for
measurement slot <x> (slot one through slot eight).
Group Measurement
Syntax
MEASUrement:MEAS<x>:REFLevel<x>?
Examples
MEASUREMENT:MEAS1:REFLEVEL?
might return
MEASUREMENT:MEAS1:REFLEVEL1:METHOD RELATIVE; ABSOLUTE:HIGH
0.00000000; LOW 0.00000000;MID
0.00000000
.
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