◇
34
Figure 4.3.4 OS setting interface
Open short circuit detection (OS) test parameters are as follows
OPEN
：
10%
～
100%, 1%
Open circuit determination threshold lower
limit
SHRT
：
OFF
～
100%
～
500%
STEP: 10%
Short circuit determination threshold upper
limit
STAN
：
Previous Standard
Standard Value (check remark)
GET
Get the current distribution parameter as the
standard value
Remarks:
1.
When the cursor is at the standard value (above figure) position, (F5) Function key position
display (GET).
2.
Press the (F5) function key at this time, the instrument enters the standard value sampling
state. When sampling, the instrument will output a voltage of 100V to automatically obtain
the current flowing through the DUT within 100 milliseconds. (There is voltage output when
GET, be careful)
3.
The capacitance value displayed by the instrument here is not the actual capacitance value,
but the value of the sampled current after impedance conversion, which should be similar to
the actual installed capacitance between the test terminals. (The sampled current is not just
generated by the capacitor)
OPEN SHORT value setting: When the fixture's open circuit capacitance value >> component’s
open circuit capacitance value
Open value: greater than the value of the instrument not connected to the DUT, less than the
minimum value of the connected DUT
Short value: Greater than the maximum value of the connected DUT, less than a larger value that
may be caused by other defects.
Taking a coil as an example: Capacitance between coils is about 50P
1.
Do not connect the DUT, "GET" test fixture open value
：
STAN=10-20P,
Confirm open circuit value 20P.
2.
Connect multiple DUTs to record GET data range: STAN=50-70P to confirm
