With the thickness measurement type (for measuring a transparent object), a selection
must also be made of the peaks between which the measurement is to be taken. If the
selected peak does not exist then a measurement is not taken. If the same peak is
selected twice in this case, 0 is output as the measured value.
NOTE
The thickness may only be measured with
specular reflection
mounting. This mode is not
available for all devices in the OD5000 series,
see "Setting diffuse or specular reflec‐
.
7.3.5.3
Teaching in the zero point
The current distance is taught in as a new zero point (reference point) or reset to the
output value.
7.3.5.4
Setting the sampling duration
The following settings are possible:
•
12.5
μ
s
•
25
μ
s
•
50
μ
s (default value)
•
100
μ
s
•
500
μ
s
•
1,000
μ
s
•
AUTO (selects the sampling rate for the quickest possible measurement depending
on the measuring object)
NOTE
If the sampling duration is set to the shortest time of 12.5
μ
s then the measuring range
is reduced.
■
Select the required range (near, medium, far) via the configuration interface.
For a sampling duration of 12.5
μ
s
Table 11: Measuring range for a sampling duration of 12.5
μ
s
OD5000-
C85W20
OD5000-
C85T20
OD5000-
C150W40
OD5000-
C150T40
Near
65.0 mm to 77.7 mm
71.5 mm to 74.3 mm (for spec‐
ular reflection)
110.0 mm to 134.4 mm
Medium (starting value)
73.5 mm to 90.8 mm
70.6 mm to 86.9 mm (for spec‐
ular reflection)
124.8 mm to 166.3 mm
Far
84.8 mm to 105.0 mm
81.0 mm to 91.5 mm (for spec‐
ular reflection)
150.2 mm to 190.0 mm
An upper and lower limit must be set for the auto setting. The actual sampling duration
is automatically adjusted within these limits.
Table 12: Adjustments for the upper and lower limit
Lower limit
Upper limit
25
μ
s (default value)
25
μ
s
50
μ
s
50
μ
s
100
μ
s
100
μ
s
OPERATION
7
8021391//2017-10-06 | SICK
O P E R A T I N G I N S T R U C T I O N S | OD5000
33
Subject to change without notice
