Schweitzer Engineering SEL-387-0, Instruction Manual

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G.12
SEL-387-0, -5, -6 Relay Instruction Manual Date Code 20170601
Distributed Network Protocol
DNP3 Documentation
Binary inputs (objects 1 and 2) are supported as defined by the previous table.
Binary inputs 0–799 and 1600–1619 are scanned approximately once every
128 ms to generate events. When time is reported with these event objects, it is
the time at which the scanner observed the bit change. This can be
significantly delayed from when the original source changed and should not
be used for sequence-of-events determination. To determine the point index
for an element, see the Binary Input Lookup Table. It is derived from the
Relay Word Bits tables in
Section 4: Control Logic . Locate the element in
question in the table and note the Relay Word row number. From that row
number, subtract the row number of the first Relay Word row (usually 2) and
multiply that result by 8. This is the index of the right-most element of the
Relay Word row of the element in question. Count over to the original element
and add that to get the point index. Binary Inputs 800–1599 are derived from
Table G.6 SEL-387-5 and SEL-387-6 Relays Continuation of Wye/Delta DNP Data Map
SEL-387-5 Relay SEL-387-6 Relay
Type Index Description Type Index Description
30,32 173–200 Reserved 30,32 173 Ambient temperature
30,32 201 Event type (See Event Cause table,
following) 30,32 174–176 Thermal Load (A, B, C)
30,32 202 Fault Targets (bit 15:EN, bit 8:51,
and bit 7:A–bit 0:W4) 30,32 177–179 In-Service Cooling System
(A, B, C)
30,32 203–205 Fault Currents Winding 1 (A, B, C) 30,32 180–182 Calculated Top-Oil Temperature
(A, B, C)
30,32 206–208 Fault Currents Winding 2 (A, B, C) 30,32 183–185 Measured Top-Oil Temperature
(A, B, C)
a
a
Error code = 400 (when measured top-oil temperature is not available).
30,32 209–211 Fault Currents Winding 3 (A, B, C) 30,32 186–188 Hot-Spot Temperature (A, B, C)
30,32 212–214 Fault Currents Winding 4 (A, B, C) 30,32 189–191 Aging Acceleration Factor, FAA
(A, B, C)
30,32 215 Fault settings group 30,32 192–194 Rate of Loss-of-Life (A, B, C)
30,32 216–218 Fault time in DNP format (high,
middle, and low 16 bits) 30,32 195–197 Total Loss-of-Life (A, B, C)
30,32 198–200 Time to assert TLL (A, B, C)
b
b
Infinite marker = –1 (when RLOL = 0).
30,32 201 Event Type (See Event Cause table,
following)
30,32 202 Fault Targets (bit 15:EN, bit 8:51,
and bit 7:A-bit 0:W4)
30,32 203–205 Fault Currents Winding 1 (A, B, C)
30,32 206–208 Fault Currents Winding 2 (A, B, C)
30,32 209–211 Fault Currents Winding 3 (A, B, C)
30,32 212–214 Fault Currents Winding 4 (A, B, C)
30,32 215 Fault settings group
30 216–218 Fault time in DNP format (high,
middle, and low 16 bits)
30,32 219–230 Measured RTD temperatures
(RTD 1A–RTD 12A) 30,32 219–230 Measured RTD temperatures
(RTD 1A–RTD 12A)
30,32 231–242 Measured RTD temperatures
(RTD 1B–RTD 12B) 30,32 231–242 Measured RTD temperatures
(RTD 1B–RTD 12B)
40,41 00 Active settings group 40,41 00 Active settings group