NXP Semiconductors
UM11637
FRDMGD3160DCMHB evaluation board
Measurements tab
•
Allows monitoring and graphing of ADC and temperature values
Figure 32. Measurements tab
UM11637
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2022. All rights reserved.
User guide
Rev. 2 — 3 February 2022
36 / 42