The Spectrum Application (RF Measurements)
R&S
®
FPL1000
148
User Manual 1178.3370.02 ─ 11
●
Increase the
RBW
to minimize the measurement time; however, consider the
requirements of the standard if you need to measure according to standard! The
automatic settings are always according to standard.
●
Take advantage of the
speed optimization mode
in the "Sweep" settings if you do
not require the larger dynamic range (see
●
Reduce the
"Sweep Time"
and thus the amount of data to be captured and calcu-
lated; however, consider the requirements regarding the standard deviation.
●
To improve the
stability of the measured results
, increase the "Sweep Time" ,
which also leads to more averaging steps.
●
Instead of
trace averaging
, use an RMS detector with a higher "Sweep Time" to
obtain better average power results in less time.
●
To determine a
channel power level
quickly, use the
(TDP) rather than a Channel Power measurement. The TDP measure-
ment is a zero span measurement where the sweep time determines the measure-
ment time. Due to the FFT measurement, duplicate averaging is performed, provid-
ing very stable results very quickly.
Note, however, that for TDP measurements, channel filters are not available and a
fixed RBW is used. Thus, the measurement may not be according to standard for
some test cases.
6.2.4.8
Reference: Predefined CP/ACLR Standards
When using predefined standards for ACLR measurement, the test parameters for the
channel and adjacent-channel measurements are configured automatically.
You can select a predefined standard via the "CP / ACLR Standard" softkey in the "Ch
Power" menu or the selection list in the "General Settings" tab of the "ACLR Setup"
dialog box (see
Table 6-10: Predefined CP / ACLR standards with remote command parameters
Standard
Remote parameter
None
NONE
EUTRA/LTE Square
EUTRa
EUTRA/LTE Square/RRC
REUTra
W-CDMA 3GPP FWD
FW3Gppcdma
W-CDMA 3GPP REV
RW3Gppcdma
WLAN 802.11A
AWLAN
WLAN 802.11B
BWLAN
RFID 14443
RFID14443
TETRA
TETRa
Measurements and Results
