R&S ZVL
GUI Reference
Channel Menu
Operating Manual 1303.6580.32-06
251
factor at both ports is zero). No load and offset parameters need to be set.
Remote control:
[SENSe<Ch>:]CORRection:CKIT:<conn_type>:<std_type>
Calibration Standard Types
The following table gives an overview of the different standards and their offset and load models:
Standard
Type
Characteristics Ideal
Standard
Offset
Model
Load
Model
Open
Open circuit (one-port)
V
Short
Short circuit (one-port)
0
V
Offset short
Short circuit with added electrical length offset, for
waveguide calibration (one-port)
0
V
Match
Matched broadband termination (one-port)
Z
0
(reference impedance
of the connector type)
Sliding
match
One-port standard consisting of an air line with a
movable, low-reflection load element (sliding load). .
–
–
–
Reflect
Unknown mismatched standard (one-port)
V
Through
Through-connection with minimum loss (two-port)
–
–
Line1, Line 2
Line(s) for TRL calibration with minimum loss (two-
port)
–
–
Attenuation
Fully matched standard in both directions (two-port;
the reflection factor at both ports is zero).
–
–
–
Symm.
network
Unknown mismatched reflection-symmetric standard
(two-port)
–
Remote control:
For an overview of standard parameters see also
[SENSe<Ch>:]CORRection:CKIT:<conn_type>:<std_type>
Sweep
The
Sweep
submenu defines the scope of measurement in the current channel. This includes the sweep
type with various parameters, the periodicity of the measurement, and the sweep average.
Sweeps
A sweep is a series of consecutive measurements taken over a specified sequence of stimulus values. It
represents the basic measurement cycle of the analyzer.
The analyzer can perform sweeps at constant power but variable frequency (frequency sweeps); see
Sweep Type.
The sweeps are further specified by the number of measurement points, the total measurement time and
the trigger mode. A measurement may consist of a single sweep or a series of sweeps repeated
continuously.
On the other hand, depending on the measurement task and the measured quantity, the measurement at
each point can consist of several partial measurements with definite hardware settings.
