R&S FSW Series, User Manual

Page: 244 / 1450

Measurements and Results
R&S
®
FSW
244 User Manual 1173.9411.02 ─ 43
Although a margin functionality is not available for the limit check, a margin (threshold)
for the peak values to be displayed in the Result Summary can be defined. (In the "List
Evaluation" settings, see
Chapter 7.6.5.7, "List Evaluation (Results Configuration)" ,
on page 265).
7.6.4.3 Fast SEM Measurements
To improve the performance of the R&S FSW for spectrum emission mask measure-
ments, a "Fast SEM" mode is available. If this mode is activated, several consecutive
ranges with identical sweep settings are combined to one sweep internally, which
makes the measurement considerably faster. The displayed results remain unchanged
and still consist of several ranges. Thus, measurement settings that apply only to the
results, such as limits, can nevertheless be defined individually for each range.
Prerequisites
"Fast SEM" mode is available if the following criteria apply:
●
The frequency ranges are consecutive, without frequency gaps
●
The following sweep settings are identical (for details see Chapter 7.6.5.1, "Sweep
List" , on page 251):
– "Filter Type"
– "RBW"
– "VBW"
– "Sweep Time Mode"
– "Reference Level"
– "RF Attenuation Mode"
– "RF Attenuation"
– "Preamplifier"
Activating Fast SEM mode
"Fast SEM" mode is activated in the sweep list (see Chapter 7.6.5.1, "Sweep List" ,
on page 251) or using a remote command. Activating the mode for one range auto-
matically activates it for all ranges in the sweep list.
Remote command :
[SENSe:]ESPectrum<sb>:HSPeed
on page 922
Spectrum Emission Mask (SEM) Measurement