LTE Multi Evaluation Measurement
R&S
®
CMW-KM5xx/-KS5xx
536
User Manual 1173.9628.02 ─ 16
For query of the results via remote control, see
chapter 3.5.3.31, "BLER Results"
3.2.6.12
Selecting and Modifying Views
Use the "Display" parameters to select the views and to change the appearance and
contents of the views. Depending on the selected view the following "Display" hotkeys
are available at the bottom of the GUI:
Hotkey
Description
"Select View ..."
Switch to a certain detailed view or overview.
Alternatively select a diagram in the overview and press ENTER or the
rotary knob.
"Select Trace ..."
Select the trace types to be displayed in the view.
"X Scale... / Y Scale..."
Modify the ranges of the X-axis and the Y-axis.
"EVM Window Position ..."
Select which of the results calculated at the low and high extremities of the
EVM window shall be displayed; see
chapter 3.2.1.7, "Calculation of Modu-
"Margin On | Off"
For the spectrum emission mask measurement: show or hide margin
results
Additional options are available in the "Measurement Control" section of the configura-
tion dialog.
3.2.6.13
Using Markers
Use the "Marker" parameters to activate markers and to modify their position. The fol-
lowing "Marker" hotkeys are available at the bottom of the GUI:
Hotkey
Description
"Ref. Marker ..."
Enable or disable the reference marker and select the marker position. If sev-
eral traces can be displayed, a trace can also be selected.
"Marker 1 /2 ..."
Enable or disable marker 1 or 2 and define the marker position (absolute or rel-
ative to the reference marker).
Depending on the trace mode, a trace can also be selected.
"Select Trace Mode"
Define whether marker 1 and 2 are set to the same trace as the reference
marker (collective) or to selectable individual traces.
See also: "Markers" in the R&S
CMW user manual, chapter "System Overview"
3.2.6.14
Common View Elements
This section describes elements that are displayed in most views.
General Description
深圳德标仪器
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