Philips Semiconductors
Product specification
SA5223
Wide dynamic range AGC transimpedance amplifier(150MHz)
1995 Oct 24
4
TEST CIRCUITS
Test Circuit 1: Bandwidth
NETWORK ANALYZER
S-PARAMETER TEST SET
PORT1
PORT2
VCC
.1uF
.1uF
50
ZO = 50
Ω
OUT
OUT
IN DUT
0.1uF
R=1k
50
GND
1
SINGLE-ENDED
GND
2
R
TSE
+
12.4
@
S
21
@
R
IN
,
R
IN
+
1k
)
R
INSS
[
1250
W
ZO = 50
Ω
SD00370
500
500
Test Circuit 2: Noise
SPECTRUM ANALYZER
VCC
OUT
OUT
IN DUT
GND
2
GND
1
NE5209
50
Ω
.1
µ
F
.1
µ
F
1.0
µ
F
1.0
µ
F
CS
50
Ω
SD00371
NETWORK ANALYZER
S-PARAMETER TEST SET
PORT1
PORT2
VCC
.1uF
.1uF
OUT
OUT
IN DUT
GND
2
GND
1
50
Ω
CAL
UNBAL.
0.1uF
NC
50
Ω
BIAS TEE
5V
NHO300HB
TRANSFORMER
CONVERSION
LOSS = 9dB
100
Ω
BAL.
SD00372
Test Circuit 3: PSRR
Test Circuit 4: Duty Cycle Distortion
PULSE GEN
OUT
OUT
DUT
OSCILLOSCOPE
A
B
Meaurement done using
differential wave forms
5V
0.1uF
.1
µ
F
.1
µ
F
GND1
GND2
ZO = 50
Ω
ZO = 50
Ω
IN
500
Ω
500
Ω
1k
Ω
50
Ω
OFFSET
SD00373
50% DUTY CYCLE
