Philips Semiconductors
SA5211
Transimpedance amplifier (180 MHz)
Product specification
Rev. 03 — 07 October 1998
3 of 28
9397 750 07427
© Philips Electronics N.V. 2001. All rights reserved.
7.
Static characteristics
[1]
Test condition: output quiescent voltage variation is less than 100 mV for 3 mA load current.
8.
Dynamic characteristics
Table 3:
Recommended operating conditions
Symbol
Parameter
Conditions
Min
Max
Unit
V
CC
supply voltage
4.5
5.5
V
T
amb
ambient temperature range
-40
+85
°
C
T
J
junction temperature range
-40
+105
°
C
Table 4:
DC electrical characteristics
Min and Max limits apply over operating temperature range at V
CC
= 5 V, unless otherwise specified. Typical data apply at
V
CC
= 5 V and T
amb
= 25
°
C.
Symbol
Parameter
Test conditions
Min
Typ
Max
Unit
V
IN
input bias voltage
0.55
0.8
1.00
V
V
O
±
output bias voltage
2.7
3.4
3.7
V
V
OS
output offset voltage
−
0
130
mV
I
CC
supply current
20
26
31
mA
I
OMAX
output sink/source current
3
4
−
mA
I
IN
input current
(2% linearity)
Test Circuit 8,
Procedure 2
±
20
±
40
−
µ
A
I
IN MAX
maximum input current
overload threshold
Test Circuit 8,
Procedure 4
±
30
±
60
−
µ
A
Table 5:
AC electrical characteristics
Typical data and Min and Max limits apply at V
CC
= 5 V and T
amb
= 25
°
C
Symbol
Parameter
Test conditions
Min
Typ
Max
Unit
R
T
transresistance (differential output)
DC tested RL =
∞
Test Circuit 8, Procedure 1
21
28
36
k
Ω
R
O
output resistance (differential output)
DC tested
−
30
−
Ω
R
T
transresistance (single-ended output)
DC tested
RL =
∞
10.5
14
18.0
k
Ω
R
O
output resistance (single-ended output)
DC tested
−
15
−
Ω
f
3dB
bandwidth (-3dB)
T
A
= 25
°
C
Test circuit 1
−
180
−
MHz
R
IN
input resistance
−
200
−
Ω
C
IN
input capacitance
−
4
−
pF
∆
R/
∆
V
transresistance power supply sensitivity
V
CC
= 5
±
0.5 V
−
3.7
−
%/V
∆
R/
∆
T
transresistance ambient temperature sensitivity
∆
T
amb
= T
amb MAX
-T
amb MIN
−
0.025
−
%/
°
C
I
N
RMS noise current spectral density (referred to
input)
Test Circuit 2
f = 10 MHz
TA = 25
°
C
−
1.8
−
pA/
√
Hz
I
T
integrated RMS noise current over the
bandwidth (referred to input)
TA = 25
°
C
Test Circuit 2
−
−
−
−