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SWJ-DP
SELECT[31:24] (APSEL) selects the AP
SELECT[7:4] (APBANKSEL) selects the bank
A[3:2] from the APACC selects the register
within the bank
AHB Access Port
(AHB-AP)
MDM-AP
St
at
us
0x
00
Co
nt
ro
l
0x
01
ID
R
0x
3F
AHB-AP
SELECT[31:24] = 0x00 selects the AHB-AP
See Arm documentation for further details
MDM-AP
SELECT[31:24] = 0x01 selects the MDM-AP
SELECT[7:4] = 0x0 selects the bank with Status and Ctrl
A[3:2] = 2’b00 selects the Status Register
A[3:2] = 2’b01 selects the Control Register
SELECT[7:4] = 0xF selects the bank with IDR
A[3:2] = 2’b11 selects the IDR Register
(IDR register reads 0x001C_0000)
Bus Matrix
See Control and Status Register
Descriptions
Data[31:0]
A[7:4] A[3:2] RnW
APSEL
Decode
Deb
ug P
or
t ID R
egist
er (DPIDR)
C
ontr
ol/St
atus (CTRL/S
TA
T)
AP Select (SELECT)
R
ead Buf
fer (REB
UFF)
DP Registers
0x0
0
0x04
0x08
0x0C
Data[31:0]
A[3:2] RnW
DPACC
Data[31:0]
A[3:2] RnW
APACC
Debug Port
(DP)
Generic
See the Arm Debug Interface v5p1 Supplement.
Debug
Port
Internal
Bus
Access
Port
Figure 50-3. MDM AP addressing
50.6.1 MDM-AP Control Register
Table 50-8. MDM-AP Control Register assignments
Bit
Name
Command
available in
secure mode?
Description
0
Flash memory mass erase in
progress
Yes
Set to cause mass erase. Cleared by hardware after mass
erase operation completes.
When mass erase is disabled (via MEEN and SEC settings),
the erase request does not occur and the Flash Mass Erase
in Progress bit continues to assert until the next system reset.
1
Debug disable
No
Set to disable debug. Clear to allow debug operation.
2
Debug request
No
Set to force the core to halt.
Table continues on the next page...
Chapter 50 Debug
MWCT101xS Series Reference Manual, Rev. 3, 07/2019
NXP Semiconductors
1719
Summary of Contents for MWCT101 S Series
Page 2: ...MWCT101xS Series Reference Manual Rev 3 07 2019 2 NXP Semiconductors...
Page 42: ...MWCT101xS Series Reference Manual Rev 3 07 2019 42 NXP Semiconductors...
Page 50: ...Conventions MWCT101xS Series Reference Manual Rev 3 07 2019 50 NXP Semiconductors...
Page 70: ...Aliased bit band regions MWCT101xS Series Reference Manual Rev 3 07 2019 70 NXP Semiconductors...
Page 78: ...Pinout diagrams MWCT101xS Series Reference Manual Rev 3 07 2019 78 NXP Semiconductors...
Page 96: ...WCT101xS safety concept MWCT101xS Series Reference Manual Rev 3 07 2019 96 NXP Semiconductors...
Page 130: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 130 NXP Semiconductors...
Page 284: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 284 NXP Semiconductors...
Page 430: ...Functional Description MWCT101xS Series Reference Manual Rev 3 07 2019 430 NXP Semiconductors...
Page 472: ...Application Information MWCT101xS Series Reference Manual Rev 3 07 2019 472 NXP Semiconductors...
Page 528: ...Module clocks MWCT101xS Series Reference Manual Rev 3 07 2019 528 NXP Semiconductors...
Page 634: ...SRAM configuration MWCT101xS Series Reference Manual Rev 3 07 2019 634 NXP Semiconductors...
Page 818: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 818 NXP Semiconductors...
Page 960: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 960 NXP Semiconductors...
Page 992: ...ADC calibration scheme MWCT101xS Series Reference Manual Rev 3 07 2019 992 NXP Semiconductors...
Page 1348: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1348 NXP Semiconductors...
Page 1366: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1366 NXP Semiconductors...
Page 1514: ...Functional description MWCT101xS Series Reference Manual Rev 3 07 2019 1514 NXP Semiconductors...
Page 1726: ...Debug and security MWCT101xS Series Reference Manual Rev 3 07 2019 1726 NXP Semiconductors...
Page 1760: ...MWCT101xS Series Reference Manual Rev 3 07 2019 1760 NXP Semiconductors...