NXP Semiconductors MPC5644A, Reference Manual, Page: 241 / 1735

Flash memory
MPC5644A Microcontroller Reference Manual, Rev. 6
Freescale Semiconductor 241
12.3.2.13 User Test 2 (UT2) Register
12.3.2.14 User Multiple Input Signature Register [0:4] (UMISRn)
The User Multiple Input Signature Registers (UMISR n ) provide a means to evaluate array integrity.
Offset: FLASH_REG 0x0040 Access: User read/write
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
R
DAI
W
Reset 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
R
DAI
W
Reset 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Figure 12-14. User Test 1 (UT1) Register
Table 12-16. UT1 field descriptions
Field Description
DAI
[31:0] Data Array Input
These bits enable checks of ECC logic by allowing data bits to be input into the ECC logic and then
read out by doing array reads or array integrity checks. The DAI[31:0] correspond to the 32 Array bits
representing Word 0 of the double word selected in the AR.
Offset: FLASH_REG 0x0044 Access: User read/write
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
R
DAI
W
Reset 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
R
DAI
W
Reset 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Figure 12-15. User Test 2 (UT2) Register
Table 12-17. UT2 field descriptions
Field Description
DAI
[63:32] Data Array Input
These bits enable checks of ECC logic by allowing data bits to be input into the ECC logic and then
read out by doing array reads or array integrity checks. The DAI[63:32] correspond to the 32 Array
bits representing Word 1of the double word selected in the AR.