NXP Semiconductors MPC5605BK, Reference Manual

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Chapter 9 Reset Generation Module (MC_RGM)
MPC5606BK Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor 187
9.3.1.7 Functional Event Short Sequence Register (RGM_FESS)
This register defines which reset sequence will be done when a functional reset sequence is triggered. The
functional reset sequence can either start from PHASE1 or from PHASE3, skipping PHASE1 and
PHASE2.
NOTE
This could be useful for fast reset sequence, for example to skip flash reset.
It can be accessed in read/write in either supervisor mode or test mode. It can be accessed in read in user
mode.
NOTE
This register is reset on any enabled destructive or functional reset event.
9.3.1.8 Functional Bidirectional Reset Enable Register (RGM_FBRE)
This register enables the generation of an external reset on functional reset. It can be accessed in read/write
in either supervisor mode or test mode. It can be accessed in read in user mode.
Address 0xC3FE_4018 Access: User read, Supervisor read, Test read
R
SS
_EXR
0 0 0 0 0 0
CHKST
OP
W
POR 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Figure 9-8. Functional Event Short Sequence Register (RGM_FESS)
Table 9-9. Functional Event Short Sequence Register (RGM_FESS) field descriptions
Field Description
SS_EXR Short Sequence for External Reset
0 The reset sequence triggered by an external reset event will start from PHASE1
1 The reset sequence triggered by an external reset event will start from PHASE3, skipping
PHASE1 and PHASE2
Address 0xC3FE_401C Access: User read, Supervisor read/write, Test read/write
R
B
E
_EXR
0 0 0 0 0 0
CHKST
OP
W
POR 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Figure 9-9. Functional Bidirectional Reset Enable Register (RGM_FBRE)