Table 4-9. Flash and EEPROM commands by mode and security state (continued)
FCMD
Command
Unsecured
Secured
U
U
0x0D
Set user margin level
*
N/A
0x10
Erase verify EEPROM section
*
*
0x11
Program EEPROM
*
N/A
0x12
Erase EEPROM sector
*
N/A
1. Unsecured User mode
2. Secured User mode
4.5.2.5 Flash and EEPROM interrupts
The flash and EEPROM module can generate an interrupt when a flash command
operation has completed or when a flash and EEPROM command operation has detected
an ECC fault.
Table 4-10. Flash interrupt source
Interrupt source
Interrupt flag
Local enable
Global (CCR) mask
Flash and EEPROM command complete
CCIF
(FSTAT register)
CCIE
(FCNFG register)
I Bit
ECC double bit fault on flash and EEPROM read
DFDIF
(FERSTAT register)
DFDIE
(FERCNFG register)
I Bit
ECC single bit fault on flash and EEPROM read
SFDIF
(FERSTAT register)
SFDIE
(FERCNFG register)
I Bit
4.5.2.5.1 Description of flash and EEPROM interrupt operation
The flash module uses the FSTAT[CCIF] flag in combination with the FCNFG[CCIE]
interrupt enable bit to generate the flash command interrupt request. The flash module
uses the DFDIF and SFDIF flags in combination with the FERSTAT[DFDIE] and
FERSTAT[SFDIE] interrupt enable bits to generate the flash error interrupt request.
The logic used for generating the flash module interrupts is shown in the following
figure.
Flash and EEPROM
MC9S08PA4 Reference Manual, Rev. 5, 08/2017
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NXP Semiconductors
Summary of Contents for MC9S08PA4
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Page 232: ...Functional Description MC9S08PA4 Reference Manual Rev 5 08 2017 232 NXP Semiconductors ...
Page 258: ...FTM Interrupts MC9S08PA4 Reference Manual Rev 5 08 2017 258 NXP Semiconductors ...
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