NXP Semiconductors K32 L2A Series, Reference Manual, Page: 1280 / 1379

49.4.10 Out-of-range interrupt
If enabled, TSI will scan the electrode specified by TSI_DATA[TSICH] as soon as the
trigger arrives. The TSI_GENCS[OUTRGF] flag generates a TSI interrupt request if the
TSI_GENCS[TSIIE] bit is set and GENCS[ESOR] bit is cleared. With this configuration,
after the end-of-electrode scan, the electrode capacitance will be converted and stored to
the result register TSI_DATA[TSICNT], the out-of-range interrupt is only requested if
there is a considerable capacitance change defined by the TSI_TSHD. For instance, if in
low power mode the electrode capacitance does not vary, the out-of-range interrupt does
not interrupt the CPU. This interrupt will not happen in noise detection mode. It is worthy
to note that when the counter value reaches 0xFFFF is treated as an extreme case the out-
of-range will not happen. Also in noise detection mode, the out-of-range will not assert
either.
49.4.11 Wake up MCU from low power modes
In low power modes, once enabled by TSI_GENCS[STPE] and TSI_GENCS[TSIIE],
TSI can bring MCU out of its low power modes(STOP, VLPS, VLLS,etc) by either end
of scan or out of range interrupt, that is, if TSI_GENCS[ESOR] is set, end of scan
interrupt is selected and otherwise, out of range is selected.
49.4.12 DMA function support
Transmit by DMA is supported only when TSI_DATA[DMAEN] is set. A DMA transfer
request is asserted when all the flags based on TSI_GENCS[ESOR] settings and
TSI_GENCS[TSIIE] are set. Then the on-chip DMA controller detects this request and
transfers data between memory space and TSI register space. After the data tranfer, DMA
DONE is asserted to clear TSI_GENCS[EOSF] automatically. This function is normally
used by DMA controller to get the conversion result from TSI_DATA[TSICNT] upon a
end-of-scan event and then refresh the channel index(TSI_DATA[TSICH]) for next
trigger.
49.4.13 Noise detection mode
The noise detection mode change the circuit configuration as shown in the following
figure. With this configuration, it is possible to detect touch with high levels of EMC
noise present. To enter the test mode, see TSI_GENCS[MODE] register field.
Functional description
K32 L2A Reference Manual, Rev. 2, 01/2020
1280 NXP Semiconductors