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48.1.3.3.25.4 Fields
Field
Function
31-27
—
Reserved. Always 0.
26-16
R6P_1_CT
Runs of One, Length 6+ Count. Reads the final Runs of Ones, length 6+ count after entropy generation.
Requires TRNG0_MCTL[PRGM] = 0.
15-11
—
Reserved. Always 0.
10-0
R6P_0_CT
Runs of Zero, Length 6+ Count. Reads the final Runs of Ones, length 6+ count after entropy generation.
Requires TRNG0_MCTL[PRGM] = 0.
48.1.3.3.26 TRNG0 Statistical Check Run Length 6+ Limit (TRNG0_SC
R6PL)
48.1.3.3.26.1 Address
Register
Offset
Description
TRNG0_SCR6PL
400A5038h
Accessible at this address when
TRNG0_MCTL[PRGM] = 1]
48.1.3.3.26.2 Function
The TRNG0 Statistical Check Run Length 6+ Limit Register defines the allowable
maximum and minimum number of runs of length 6 or more detected during entropy
generation. To pass the test, the number of runs of length 6 or more (for samples of both
0 and 1) must be less than the programmed maximum value, and the number of runs of
length 6 or more must be greater than (maximum - range). If this test fails, the Retry
Counter in TRNG0_SCMISC will be decremented, and a retry will occur if the Retry
Count has not reached zero. If the Retry Count has reached zero, an error will be
generated. Note that this offset (0x38) is used as TRNG0_SCRxC6PL only if
TRNG0_MCTL[PRGM] is 1. If TRNG0_MCTL[PRGM] is 0, this offset is used as
TRNG0_SCRxC6PC readback register.
Chapter 48 SA-TRNG Standalone
K32 L2A Reference Manual, Rev. 2, 01/2020
NXP Semiconductors
1245
Summary of Contents for K32 L2A Series
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Page 122: ...Flash Memory Clock K32 L2A Reference Manual Rev 2 01 2020 122 NXP Semiconductors...
Page 158: ...Debug and security K32 L2A Reference Manual Rev 2 01 2020 158 NXP Semiconductors...
Page 174: ...Module Signal Description Tables K32 L2A Reference Manual Rev 2 01 2020 174 NXP Semiconductors...
Page 246: ...Application information K32 L2A Reference Manual Rev 2 01 2020 246 NXP Semiconductors...
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