AO Waveform Calibration Procedure for NI-DAQmx
14
ni.com
AO Device Test Limits
The tables in this section list the accuracy specifications to use when
verifying and adjusting the NI 671
X
/672
X
/673
X
. The tables display the
specifications for both 1-year and 24-hour calibration intervals. The 1-year
ranges display the specifications that the devices should meet if it has been
one year between calibrations. When a device has been calibrated with an
external source, the values shown in the 24-hour tables are the valid
specifications.
Using the Tables
The following definitions describe how to use the information from the
tables in this section.
Range
Range
refers to the maximum allowable voltage range of an output signal.
Test Point
The
Test Point
is the voltage value that is generated for verification
purposes. This value is broken down into two columns:
Location
and
Value
.
Location
refers to where the test value fits within the test range.
Pos FS
stands for positive full-scale and
Neg FS
stands for negative
full-scale.
Value
refers to the voltage value to be verified and is in volts.
24-Hour Ranges
The
24-Hour Ranges
column contains the
Upper Limits
and
Lower Limits
for the test point value. That is, when the device is within its 24-hour
calibration interval, the test point value should fall between the upper and
lower limit values. Upper and lower limits are expressed in volts.
1-Year Ranges
The
1-Year Ranges
column contains the
Upper Limits
and
Lower Limits
for
the test point value. That is, when the device is within its 1-year calibration
interval, the test point value should fall between the upper and lower limit
values. Upper and lower limits are expressed in volts.
Counters
It is not possible to adjust the resolution of the counter/timers. Therefore,
these values do not have a 1-year or 24-hour calibration period. However,
the test point and upper and lower limits are provided for verification
purposes.
