￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭￭
6 Technical specifications
2.850.9010 IC Conductivity Detector
￭￭￭￭￭￭￭￭
17
6 Technical specifications
6.1
Conductivity measuring system
Type
￭
Microprocessor-controlled Digital Signal Processing (DSP technol-
ogy)
￭
Intelligent detector with 6 reference chromatograms
Measuring range
0 - 15,000 µS/cm without range switching
Noise
< 0.1 nS at 1 µS/cm
Linearity devia-
tions
￭
< 0.1% for conductivity values higher than 16 µS/cm
￭
< 1% for conductivity values lower than 16 µS/cm
Drift
< 0.2 nS/cm per hour
Measuring rate
10 measurements per second for optimum results without filtering
Resolution
0.0047 nS/cm
Baseline
Noise < 0.2 nS/cm typical for sequential suppression
Conductivity
detector
Cell volume
0.8 µL
Cell constant
￭
Individual calibration data saved in the detector
￭
Adjustable in the range: 13.0 - 21.0 /cm
Electrodes
Ring-shaped electrodes made from stainless steel
Materials in
contact with
eluent
Chemically inert PCTFE
Maximum oper-
ating pressure
5.0 MPa (50 bar)
Cell tempera-
ture
20 - 50 °C in increments of 5 °C
Temperature
stability
< 0.001 °C
Temperature
compensation
0 - 5%/K adjustable, default 2.3%/K
Heating time
< 30 minutes (40 °C)
