95
Reflection contrast
*
The following equipment is required (see sepa-
rate manual):
Reflector system POL (Fig. 18), special objective
RC with rotatable
λ
and
λ
/4 compensator
mounted in front, reflection contrast module
HC RC, with additional annular diaphragms for
optimising contrast.
Incident light brightfield*, alignment of
polished sections
Homogeneous illumination and uniform
definition over the whole field of view can only
be guaranteed if the surface of the specimen is
aligned at exactly 90
°
to the optical axis. A
precisely horizontal position of the object is
particularly important at high magnifications, as
the depth of field decreases as magnification
increases.
Polished specimens can be pressed plane-par-
allel onto a metal specimen slide (code no.
563 014) with the special handpress (code no.
563 035) and plasticine. The handpress has an
adjustable stop so that all specimens can be
aligned to the same height. Then only slight
refocusing is required with the fine control
during serial investigations.
Objects that do not lie flat and that cannot be
levelled with the handpress can be aligned by
autocollimation. The object is focused on the
tiltable specimen slide, for example, (code no.
562 294) at a low magnification (5x or 10x
objective).
Fig. 65
Controls for incident light brightfield, darkfield,
polarized light, ICR interference contrast, see also Fig. 23
1
Analyser (hidden, on the left of the microscope, cf Fig. 30),
2
Tube lens 1x/Bertrand lens*,
3
4-position turret* for
reflectors/filter system,
4
Incident light polarizer*,
5
Turret for
objective-side Wollaston prisms* or Pol compensator slit,
6
Contrast adjustment ICT and ICR,
7
Holes for centering keys
(field diaphragm),
8
Field diaphragm,
9
Switch lever on
diaphragm module HC RF,
10
Grey filter,
11
Aperture
diaphragm (hidden),
12
Aperture diaphragm decentration
(oblique light illumination),
13
Centration of aperture
diaphragm,
14
Filter magazine*
