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Keysight M809256PB OIF CEI-56G Rx Test Automation Application User Guide
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OIF CEI-56G MR PAM4 Tests
Test Parameters in Debug Mode
The Debug Mode in the Configure tab of the Test Application consists of
some parameters in addition to those that can be configured in the
Compliance Mode. Besides, for some of the configuration options, you may
enter custom values, which provides a greater flexibility in performing
calibrations and tests.
For the Medium Reach (MR) standard option, the following parameters are
available for configuration.
Parameters common for all tests
• Baud Rate
• Victim Generator PAM4 Symbol Mapping
• Victim Generator PAM4 Custom Symbol Mapping
• Test Channel Configuration—‘Low Loss’ corresponds to Test1 whereas
‘High Loss’ corresponds to Test2; configured to meet the COM value
• Pre-Cursor2
• Pre-Cursor
• Main Cursor
• Post-Cursor1
• Post-Cursor2
• Noise Generator Channel Selection
• Victim Analyzer Module—If ‘BERT Analyzer’ is selected, manually
configure the “Victim Analyzer Clock Source” parameter. If ‘DCI’ is
selected, manually configure the “DUT Control Interface script file” and
“DUT Control Interface Location” parameters.
• Victim Analyzer Clock Source
• Victim Analyzer PAM4 Symbol Mapping
• Victim Analyzer PAM4 Custom Symbol Mapping
• Target Error Ratio
• Target Confidence Level
• DUT Control Interface script file
• DUT Control Interface Location