6 List Sequence Measurements
List Sequence Measurements
Inband Emission Margin Results
LTE FDD Modulation Accuracy Inband Emission Margin Results are detailed here.
These results are part of LTE FDD Modulation Accuracy measurement, and they can be querried by
:MEAS|:READ|: FETCh:LSEQuencer:ACQuire{1:512}:ASTep{1:1000}:IEMission:MARGin? Or Async fetch
:FETCh:LSEQuencer:ASYNc:ACQuire{1:512}:ASTep{1:1000}:IEMission:MARGin?/qonly/ This scpi
command only available when LTE-FDD Modulation Accuracy measurement is configured in the specified
analysis step.
LTE FDD Modulation Accuracy Inband Emission Margin results are defined as below, they are comma-
separated and the length is 54.
non_
parameter_
table_
15.52288
51.47059
Index
Result Parameter
0
Results Length – The total length of the results (includes the length field itself), currently fixed to 54
1
Minimal Inband Margin - Inband margin is the difference between the inband emission limit mask and actual
measured power per non-allocated RB. Which means the margin = (Limit – Power ) in dB, and a negative margin
stands for the power exceeds the limit.
0
1
Minimal Inband Margin Index – the RB index of minimal margin results (ZERO based)
2
Number of RBs - the number of RBs in current configuration
4~53
Inband Margin per RB - The Margin result of each RB. (only the first Num_of_RB values are valid). If the RB is
active (allocated), the inband margin result will be set to NAN.
parameter_table_23.52941
52.94118
Key Path
Meas
Initial S/W Revision
A.09.50
Help Map ID
0
Detected Slot Number
LTE FDD Modulation Accuracy detected slot number results are detailed here.
These results are part of LTE FDD Modulation Accuracy measurement, and they can be queried by
:MEAS|:READ|: FETCh:LSEQuencer:ACQuire{1:512}:ASTep{1:1000}:SLOT[:DETect]? or Asnc Fetch
:FETCh:LSEQuencer:ASYNc:ACQuire{1:512}:ASTep{1:1000}:SLOT[:DETect]?
These scpi commands are only available when LTE-FDD Modulation Accuracy measurement is configured
in the specified analysis step.
Sequence Analyzer User's & Programmer's Reference
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