Keysight Technologies B2900 Series, User Manual

Page: 208 / 234

6-20 Keysight B2900 User’s Guide, Edition 5
Function Details
Limit Test
Limit Test
Limit test is a pass/fail judgement performed for a measurement data or math result
data obtained by a channel. It can be performed if both individual limit test and
composite limit test are set to ON. Maximum of twelve limit tests can be defined
and used for the bins of composite limit test.
Composite limit test supports the following two operation modes.
• Grading mode
Performs limit test for up to 12 test limits (bins) until a failure is detected. See
Figure 6-5 for an example flowchart.
• Sorting mode
Performs limit test for up to 12 test limits (bins) until a pass is detected. See
Figure 6-6 for an example flowchart.
In the figures, SOT is the start-of-test strobe pulse sent by the component handler
connected to B2900 via the Digital I/O connector.
To set the composite limit test, see “Composite Limit Test Setup dialog box” on
page 4-33 .
To set the individual limit tests, see “Limit Test Setup dialog box” on page 4-34 .
The composite limit test result Pass or Fail is displayed with the measurement result
data on the Single or Dual view. To display the limit test result log, see
“Limit Test
Result dialog box” on page 4-41 .
NOTE Limit test for the math result
If the math expression refers to a measurement result data by multiple channels, the
acquire trigger count for the channels must be the same.
If the math expression contains a vector operation, the acquire trigger count must be
equal to or greater than the maximum number of the vector.