Keysight Technologies B2900 Series, User Manual

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Keysight B2900 User’s Guide, Edition 5 5-29
Front Panel Operations
To Execute Limit Test
12. In the /SOT field, set the DIO pin number used for the start-of-test (SOT) signal
output.
13. In the /EOT field, set the DIO pin number used for the end-of-test (EOT) signal
output.
14. To apply the settings, press Apply.
To apply the settings and close the dialog box, press OK.
To cancel the setting change, press the Cancel/Local key.
To Set Individual Limit Tests
For details on the setup parameters, see “Limit Test Setup dialog box” on page 4-34 .
1. Press the Function > Limit Test > Limits function keys.
The Limit Test Setup dialog box opens.
2. In the Ch field, set the channel to which the setting change is applied.
3. In the Feed Data field, set the type of data used for the pass/fail judgement of the
limit test.
MATH: Calculation result data of math expression
VOLTS: Voltage measurement data (Vmeas)
AMPS: Current measurement data (Imeas)
OHMS: Resistance data (=Vmeas/Imeas)
4. In the Test Index field, set the index of the limit test between numbers 1 and 12.
The index numbers 1 to 12 are associated with the bin numbers 1 to 12. See “To
Display Limit Test Result” on page 5-31 .
5. In the Limit Test field, set the limit test ON (enable) or OFF (disable) for the test
identified by Test Index.
6. In the Function field, set the test mode COMPLIANCE (compliance check) or
LIMIT (limit test).
7. When the operation mode is SORTING, set a bit pattern that represents the limit
test pass state (Pass) in the Pass Pattern field.
8. When the test mode is COMPLIANCE, configure the following settings:
• In the Fail on field, set the fail judgement method IN or OUT.
IN: Failure if the channel goes into the compliance state.